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Jacques Taillefer: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Meng Lu, Yvon Savaria, Bing Qiu, Jacques Taillefer
    IEEE 1149.1 Based Defect and Fault Tolerant Scan Chain for Wafer Scale Integration. [Citation Graph (0, 0)][DBLP]
    DFT, 2003, pp:18-25 [Conf]

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