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Piero Olivo: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Cecilia Metra, Michele Favalli, Piero Olivo, Bruno Riccò
    Design Rules for CMOS Self Checking Circuits with Parametric Faults in the Functional Block. [Citation Graph (0, 0)][DBLP]
    DFT, 1993, pp:271-278 [Conf]
  2. Cecilia Metra, Michele Favalli, Piero Olivo, Bruno Riccò
    A Highly Testable 1-out-of-3 CMOS Checker. [Citation Graph (0, 0)][DBLP]
    DFT, 1993, pp:279-286 [Conf]
  3. Michele Favalli, Marcello Dalpasso, Piero Olivo, Bruno Riccò
    Modeling of Broken Connections Faults in CMOS ICs. [Citation Graph (0, 0)][DBLP]
    EDAC-ETC-EUROASIC, 1994, pp:159-164 [Conf]
  4. Marcello Dalpasso, Michele Favalli, Piero Olivo, Bruno Riccò
    Parametric Bridging Fault Characterization for the Fault Simulation of Library-Based ICs. [Citation Graph (0, 0)][DBLP]
    ITC, 1992, pp:486-495 [Conf]
  5. Michele Favalli, Marcello Dalpasso, Piero Olivo, Bruno Riccò
    Analysis of Steady State Detection of Resistive Bridging Faults in BiCMOS Digital ICs. [Citation Graph (0, 0)][DBLP]
    ITC, 1992, pp:466-475 [Conf]
  6. Michele Favalli, Marcello Dalpasso, Piero Olivo, Bruno Riccò
    Analyss of Dynamic Effects of Resistive Bridging Faults in CMOS and BiCMOS Digital ICs. [Citation Graph (0, 0)][DBLP]
    ITC, 1993, pp:865-874 [Conf]
  7. Michele Favalli, Piero Olivo, Maurizio Damiani, Bruno Riccò
    CMOS Design for Improved IC Testability. [Citation Graph (0, 0)][DBLP]
    ITC, 1989, pp:934- [Conf]
  8. Mattia Lanzoni, Piero Olivo, Bruno Riccò
    A Testing Technique to Characterize E^2PROM's Aging and Endurance. [Citation Graph (0, 0)][DBLP]
    ITC, 1989, pp:391-396 [Conf]
  9. Cecilia Metra, Michele Favalli, Piero Olivo, Bruno Riccò
    CMOS Checkers with Testable Bridging and Transistor Stuck-on Faults. [Citation Graph (0, 0)][DBLP]
    ITC, 1992, pp:948-957 [Conf]
  10. Piero Olivo, Maurizio Damiani, Bruno Riccò
    On the Design of Multiple-Input Shift-Registers for Signature Analysis Testing. [Citation Graph (0, 0)][DBLP]
    ITC, 1989, pp:936- [Conf]
  11. Piero Olivo, Marcello Dalpasso
    Self-Learning Signature Analysis for Non-Volatile Memory Testing. [Citation Graph (0, 0)][DBLP]
    ITC, 1996, pp:303-308 [Conf]
  12. Alessandro Bogliolo, Maurizio Damiani, Piero Olivo, Bruno Riccò
    Reliability evaluation of combinational logic circuits by symbolic simulation. [Citation Graph (0, 0)][DBLP]
    VTS, 1995, pp:235-243 [Conf]
  13. Marcello Dalpasso, Michele Favalli, Piero Olivo
    Test pattern generation for I/sub DDQ/: increasing test quality. [Citation Graph (0, 0)][DBLP]
    VTS, 1995, pp:304-309 [Conf]
  14. Maurizio Damiani, Piero Olivo, Bruno Riccò
    Analysis and Design of Linear Finite State Machines for Signature Analysis Testing. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 1991, v:40, n:9, pp:1034-1045 [Journal]
  15. Marcello Dalpasso, Michele Favalli, Piero Olivo, Bruno Riccò
    Fault simulation of parametric bridging faults in CMOS IC's. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 1993, v:12, n:9, pp:1403-1410 [Journal]
  16. Maurizio Damiani, Piero Olivo, Michele Favalli, Silvia Ercolani, Bruno Riccò
    Aliasing in signature analysis testing with multiple input shift registers. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 1990, v:9, n:12, pp:1344-1353 [Journal]
  17. Maurizio Damiani, Piero Olivo, Michele Favalli, Bruno Riccò
    An analytical model for the aliasing probability in signature analysis testing. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 1989, v:8, n:11, pp:1133-1144 [Journal]
  18. Silvia Ercolani, Michele Favalli, Maurizio Damiani, Piero Olivo, Bruno Riccò
    Testability measures in pseudorandom testing. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 1992, v:11, n:6, pp:794-800 [Journal]
  19. Michele Favalli, Marcello Dalpasso, Piero Olivo
    Modeling and simulation of broken connections in CMOS IC's. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 1996, v:15, n:7, pp:808-814 [Journal]
  20. Michele Favalli, Piero Olivo, Maurizio Damiani, Bruno Riccò
    Fault simulation of unconventional faults in CMOS circuits. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 1991, v:10, n:5, pp:677-682 [Journal]
  21. Michele Favalli, Piero Olivo, Bruno Riccò
    A novel critical path heuristic for fast fault grading. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 1991, v:10, n:4, pp:544-548 [Journal]
  22. Michele Favalli, Piero Olivo, Bruno Riccò
    A probabilistic fault model for `analog' faults in digital CMOS circuits. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 1992, v:11, n:11, pp:1459-1462 [Journal]
  23. Cecilia Metra, Michele Favalli, Piero Olivo, Bruno Riccò
    On-line detection of bridging and delay faults in functional blocks of CMOS self-checking circuits. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 1997, v:16, n:7, pp:770-776 [Journal]
  24. Andrea Chimenton, Piero Olivo
    Reliability of erasing operation in NOR-Flash memories. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2005, v:45, n:7-8, pp:1094-1108 [Journal]
  25. Michele Favalli, Marcello Dalpasso, Piero Olivo, Bruno Riccò
    Analysis of resistive bridging fault detection in BiCMOS digital ICs. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. VLSI Syst., 1993, v:1, n:3, pp:342-355 [Journal]

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