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Dominik Kasprowicz: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Witold A. Pleskacz, Dominik Kasprowicz, Tomasz Oleszczak, Wieslaw Kuzmicz
    CMOS Standard Cells Characterization for Defect Based Testing. [Citation Graph (0, 0)][DBLP]
    DFT, 2001, pp:384-0 [Conf]
  2. Dominik Kasprowicz, Witold A. Pleskacz
    Improvement of integrated circuit testing reliability by using the defect based approach. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:6, pp:945-953 [Journal]

  3. Is there always performance overhead for regular fabric? [Citation Graph (, )][DBLP]


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