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David R. Lakin II: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Adit D. Singh, David R. Lakin II, Gaurav Sinha, Phil Nigh
    Binning for IC Quality: Experimental Studies on the SEMATECH Data. [Citation Graph (0, 0)][DBLP]
    DFT, 1998, pp:4-10 [Conf]
  2. David R. Lakin II, Adit D. Singh
    Exploiting defect clustering to screen bare die for infant mortality failures: an experimental study. [Citation Graph (0, 0)][DBLP]
    ITC, 1999, pp:23-30 [Conf]

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