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Ian M. Bell: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Stephen J. Spinks, Chris D. Chalk, Ian M. Bell, Mark Zwolinski
    Generation and Verification of Tests for Analogue Circuits Subject to Process Parameter Deviations. [Citation Graph (0, 0)][DBLP]
    DFT, 1997, pp:100-109 [Conf]
  2. Ian M. Bell, Kevin R. Eckersall, Stephen J. Spinks, Gaynor E. Taylor
    Fault Orientated Test and Fault Simulation of Mixed Signal Integrated Circuits. [Citation Graph (0, 0)][DBLP]
    ISCAS, 1995, pp:389-392 [Conf]
  3. Geir E. Sæther, Chris Toumazou, Gaynor E. Taylor, Kevin R. Eckersall, Ian M. Bell
    Concurrent Self Test of Switched Current Circuits Based on the S2I-Technique. [Citation Graph (0, 0)][DBLP]
    ISCAS, 1995, pp:841-844 [Conf]
  4. J. M. Gilbert, Ian M. Bell, D. R. Johnson
    Design, Manufacture and Test - Quality Test Estimation. [Citation Graph (0, 0)][DBLP]
    ISQED, 2002, pp:200-205 [Conf]
  5. Osama K. Abu-Shahla, Ian M. Bell
    An On-Line Self-Testing Switched-Current Integrator. [Citation Graph (0, 0)][DBLP]
    ITC, 1997, pp:463-470 [Conf]
  6. S. Yu, B. W. Jervis, Kevin R. Eckersall, Ian M. Bell
    Diagnosis of CMOS op-amps with gate oxide short faults using multilayer perceptrons. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 1997, v:16, n:8, pp:930-935 [Journal]
  7. J. M. Gilbert, Ian M. Bell
    The Effectiveness of Test in Controlling Quality Costs: A Conformability Analysis Based Approach. [Citation Graph (0, 0)][DBLP]
    J. Electronic Testing, 2007, v:23, n:4, pp:293-307 [Journal]

  8. A novel approach for automated model generation. [Citation Graph (, )][DBLP]


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