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Oleg Semenov:
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- Arman Vassighi, Oleg Semenov, Manoj Sachdev, Ali Keshavarzi
Effect of Static Power Dissipation in Burn-In Environment on Yield of VLSI. [Citation Graph (0, 0)][DBLP] DFT, 2002, pp:12-19 [Conf]
- Arman Vassighi, Oleg Semenov, Manoj Sachdev, Ali Keshavarzi
Thermal Management of High Performance Microprocessors. [Citation Graph (0, 0)][DBLP] DFT, 2003, pp:313-319 [Conf]
- Oleg Semenov, H. Sarbishaei, Manoj Sachdev
Analysis and Design of LVTSCR-based EOS/ESD Protection Circuits for Burn-in Environment. [Citation Graph (0, 0)][DBLP] ISQED, 2005, pp:427-432 [Conf]
- Oleg Semenov, Arman Vassighi, Manoj Sachdev, Ali Keshavarzi, Charles F. Hawkins
Burn-in Temperature Projections for Deep Sub-micron Technologies. [Citation Graph (0, 0)][DBLP] ITC, 2003, pp:95-104 [Conf]
- Oleg Semenov, H. Sarbishaei, Valery Axelrad, Manoj Sachdev
Novel gate and substrate triggering techniques for deep sub-micron ESD protection devices. [Citation Graph (0, 0)][DBLP] Microelectronics Journal, 2006, v:37, n:6, pp:526-533 [Journal]
Throughput of WLAN Systems with LDPC Codes and Adaptive Bit Loading. [Citation Graph (, )][DBLP]
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