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Oleg Semenov: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Arman Vassighi, Oleg Semenov, Manoj Sachdev, Ali Keshavarzi
    Effect of Static Power Dissipation in Burn-In Environment on Yield of VLSI. [Citation Graph (0, 0)][DBLP]
    DFT, 2002, pp:12-19 [Conf]
  2. Arman Vassighi, Oleg Semenov, Manoj Sachdev, Ali Keshavarzi
    Thermal Management of High Performance Microprocessors. [Citation Graph (0, 0)][DBLP]
    DFT, 2003, pp:313-319 [Conf]
  3. Oleg Semenov, H. Sarbishaei, Manoj Sachdev
    Analysis and Design of LVTSCR-based EOS/ESD Protection Circuits for Burn-in Environment. [Citation Graph (0, 0)][DBLP]
    ISQED, 2005, pp:427-432 [Conf]
  4. Oleg Semenov, Arman Vassighi, Manoj Sachdev, Ali Keshavarzi, Charles F. Hawkins
    Burn-in Temperature Projections for Deep Sub-micron Technologies. [Citation Graph (0, 0)][DBLP]
    ITC, 2003, pp:95-104 [Conf]
  5. Oleg Semenov, H. Sarbishaei, Valery Axelrad, Manoj Sachdev
    Novel gate and substrate triggering techniques for deep sub-micron ESD protection devices. [Citation Graph (0, 0)][DBLP]
    Microelectronics Journal, 2006, v:37, n:6, pp:526-533 [Journal]

  6. Throughput of WLAN Systems with LDPC Codes and Adaptive Bit Loading. [Citation Graph (, )][DBLP]

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