Yu-Jen Huang, Jin-Fu Li Testing Active Neighborhood Pattern-Sensitive Faults of Ternary Content Addressable Memories. [Citation Graph (0, 0)][DBLP] European Test Symposium, 2006, pp:55-62 [Conf]
Testability Exploration of 3-D RAMs and CAMs. [Citation Graph (, )][DBLP]
A low-cost built-in self-test scheme for an array of memories. [Citation Graph (, )][DBLP]
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