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Yu-Jen Huang: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Yu-Jen Huang, Da-Ming Chang, Jin-Fu Li
    A Built-In Redundancy-Analysis Scheme for Self-Repairable RAMs with Two-Level Redundancy. [Citation Graph (0, 0)][DBLP]
    DFT, 2006, pp:362-370 [Conf]
  2. Jin-Fu Li, Jiunn-Der Yu, Yu-Jen Huang
    A design methodology for hybrid carry-lookahead/carry-select adders with reconfigurability. [Citation Graph (0, 0)][DBLP]
    ISCAS (1), 2005, pp:77-80 [Conf]
  3. Tsu-Wei Tseng, Chun-Hsien Wu, Yu-Jen Huang, Jin-Fu Li, Alex Pao, Kevin Chiu, Eliot Chen
    A Built-In Self-Repair Scheme for Multiport RAMs. [Citation Graph (0, 0)][DBLP]
    VTS, 2007, pp:355-360 [Conf]
  4. Yu-Jen Huang, Jin-Fu Li
    Testing Active Neighborhood Pattern-Sensitive Faults of Ternary Content Addressable Memories. [Citation Graph (0, 0)][DBLP]
    European Test Symposium, 2006, pp:55-62 [Conf]

  5. Testability Exploration of 3-D RAMs and CAMs. [Citation Graph (, )][DBLP]

  6. A low-cost built-in self-test scheme for an array of memories. [Citation Graph (, )][DBLP]

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