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Tianxu Zhao: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Tianxu Zhao, Xuchao Duan, Yue Hao, Peijun Ma
    Reliability Estimation Model of ICs Interconnect Based on Uniform Distribution of Defects on a Chip. [Citation Graph (0, 0)][DBLP]
    DFT, 2003, pp:11-17 [Conf]
  2. Tianxu Zhao, Yue Hao, Yongchang Jiao
    VLSI Yield Optimization Based on the Sub-Processing-Element Level Redundancy. [Citation Graph (0, 0)][DBLP]
    DFT, 2000, pp:41-46 [Conf]
  3. Tianxu Zhao, Yue Hao, Peijun Ma, Taifeng Chen
    Relation between Reliability and Yield of IC's Based on Discrete Defect Distribution Model. [Citation Graph (0, 0)][DBLP]
    DFT, 2001, pp:48-0 [Conf]

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