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J. L. Rainard:
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- G. Masseboeuf, J. Pulou, J. L. Rainard
Hierarchical Test Analysis of VLSI Circuits for Random BIST. [Citation Graph (0, 0)][DBLP] EDCC, 1994, pp:271-288 [Conf]
- Mireille Jacomino, J. L. Rainard, Rene David
Fault Detection By Consumption Measurement in CMOS Circuits. [Citation Graph (0, 0)][DBLP] Fehlertolerierende Rechensysteme, 1987, pp:83-94 [Conf]
- P. Thorel, J. L. Rainard, A. Botta, A. Chemarin, J. Majos
Implementing Boundary-Scan and Pseudo-Random BIST in an Asynchronous Transfer Mode Switch. [Citation Graph (0, 0)][DBLP] ITC, 1991, pp:131-139 [Conf]
Some relationships between delay testing and stuck-open testing in CMOS circuits. [Citation Graph (, )][DBLP]
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