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Publications of Author

1. Maciej Bellos, Dimitrios Kagaris, Dimitris Nikolos
   Test Set Embedding Based on Phase Shifters. [Citation Graph (0, 0)][DBLP]
   EDCC, 2002, pp:90-101 [Conf]
   
2. Maciej Bellos, Dimitris Nikolos
   Deterministic Test Vector Compression / Decompression Using an Embedded Processor. [Citation Graph (0, 0)][DBLP]
   EDCC, 2005, pp:318-331 [Conf]
   
3. Maciej Bellos, Dimitris Nikolos, Haridimos T. Vergos
   Path Delay Fault Testing of a Class of Circuit-Switched Multistage Interconnection Networks. [Citation Graph (0, 0)][DBLP]
   EDCC, 1999, pp:267-282 [Conf]
   
4. Maciej Bellos, Dimitris Bakalis, Dimitris Nikolos, Xrysovalantis Kavousianos
   Low Power Testing by Test Vector Ordering with Vector Repetition. [Citation Graph (0, 0)][DBLP]
   ISQED, 2004, pp:205-210 [Conf]
   
5. Maciej Bellos, Dimitris Bakalis, Dimitris Nikolos
   Scan Cell Ordering for Low Power BIST. [Citation Graph (0, 0)][DBLP]
   ISVLSI, 2004, pp:281-284 [Conf]
   
6. Maciej Bellos, Dimitri Kagaris, Dimitris Nikolos
   Low Power Test Set Embedding Based on Phase Shifters. [Citation Graph (0, 0)][DBLP]
   ISVLSI, 2003, pp:155-160 [Conf]
   
7. Xrysovalantis Kavousianos, Dimitris Bakalis, Maciej Bellos, Dimitris Nikolos
   An Efficient Test Vector Ordering Method for Low Power Testing. [Citation Graph (0, 0)][DBLP]
   ISVLSI, 2004, pp:285-288 [Conf]
   
8. Maciej Bellos, Xrysovalantis Kavousianos, Dimitris Nikolos, Dimitri Kagaris
   DV-TSE: Difference Vector Based Test Set Embedding. [Citation Graph (0, 0)][DBLP]
   VLSI-SOC, 2003, pp:343-0 [Conf]
   
9. Dimitris Bakalis, K. Adaos, D. Lymperopoulos, Maciej Bellos, Haridimos T. Vergos, George Alexiou, Dimitris Nikolos
   A core generator for arithmetic cores and testing structures with a network interface. [Citation Graph (0, 0)][DBLP]
   Journal of Systems Architecture, 2006, v:52, n:1, pp:1-12 [Journal]
   
10. Haridimos T. Vergos, Dimitris Nikolos, Maciej Bellos, Costas Efstathiou
    Deterministic BIST for RNS Adders. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 2003, v:52, n:7, pp:896-906 [Journal]