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Sharad Saxena: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Richard C. Yee, Sharad Saxena, Paul E. Utgoff, Andrew G. Barto
    Explaining Temporal Differences to Create Useful Concepts for Evaluating States. [Citation Graph (0, 0)][DBLP]
    AAAI, 1990, pp:882-888 [Conf]
  2. Carlo Guardiani, Sharad Saxena, Patrick McNamara, Phillip Schumaker, Dale Coder
    An asymptotically constant, linearly bounded methodology for the statistical simulation of analog circuits including component mismatch effects. [Citation Graph (0, 0)][DBLP]
    DAC, 2000, pp:15-18 [Conf]
  3. Carlo Guardiani, Patrick McNamara, Lidia Daldoss, Sharad Saxena, Stefano Zanella, Wei Xiang, Suli Liu
    Analog IP Testing: Diagnosis and Optimization. [Citation Graph (0, 0)][DBLP]
    DATE, 2002, pp:192-196 [Conf]
  4. Sharad Saxena
    Evaluating alternative Instance Representations. [Citation Graph (0, 0)][DBLP]
    ML, 1989, pp:465-468 [Conf]
  5. Sharad Saxena
    On the Effect of Instance Representation on Generalization. [Citation Graph (0, 0)][DBLP]
    ML, 1991, pp:198-202 [Conf]
  6. Manidip Sengupta, Sharad Saxena, Lidia Daldoss, Glen Kramer, Sean Minehane, Jianjun Cheng
    Application Specific Worst Case Corners Using Response Surfaces and Statistical Models. [Citation Graph (0, 0)][DBLP]
    ISQED, 2004, pp:351-356 [Conf]
  7. Marko P. Chew, Sharad Saxena, Thomas F. Cobourn, Purnendu K. Mozumder, Andrzej J. Strojwas
    A New Methodology for Concurrent Technology Development and Cell Library Optimization. [Citation Graph (0, 0)][DBLP]
    VLSI Design, 1999, pp:18-25 [Conf]
  8. Manidip Sengupta, Sharad Saxena, Lidia Daldoss, Glen Kramer, Sean Minehane, Jianjun Cheng
    Application-specific worst case corners using response surfaces and statistical models. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 2005, v:24, n:9, pp:1372-1380 [Journal]
  9. Maxim Ershov, Sharad Saxena, Sean Minehane, P. Clifton, Mark Redford, R. Lindley, H. Karbasi, S. Graves, S. Winters
    Degradation dynamics, recovery, and characterization of negative bias temperature instability. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2005, v:45, n:1, pp:99-105 [Journal]

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