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Eugeni Isern: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Eugeni Isern, Joan Figueras
    Test of Bridging Faults in Scan-based Sequential Circuits. [Citation Graph (0, 0)][DBLP]
    EDAC-ETC-EUROASIC, 1994, pp:366-370 [Conf]
  2. Joan Font, J. Ginard, Eugeni Isern, Miquel Roca, Jaume Segura, Eugenio García
    A BICS for CMOS Opamps by Monitoring the Supply Current Peak. [Citation Graph (0, 0)][DBLP]
    IOLTW, 2002, pp:94-98 [Conf]
  3. Rodrigo Picos, Joan Font, Eugeni Isern, Miquel Roca, Eugenio García
    A Configurable Built in Current Sensor for Mixed Signal Circuit Testing. [Citation Graph (0, 0)][DBLP]
    IOLTS, 2003, pp:167- [Conf]
  4. Rodrigo Picos, Miquel Roca, Eugeni Isern, Sebstatià A. Bota, Eugenio García
    On-line Monitoring Capabilities of Oscillation Test Techniques: Results Demonstration in an OTA. [Citation Graph (0, 0)][DBLP]
    IOLTS, 2004, pp:179- [Conf]
  5. Eugeni Isern, Joan Figueras
    Test Generation with High Coverages for Quiescent Current Test of Bridging Faults in Combinational Circuits. [Citation Graph (0, 0)][DBLP]
    ITC, 1993, pp:73-82 [Conf]
  6. Eugeni Isern, Miquel Roca, Francesc Moll
    Analysis of the Contribution of Interconnect Effects in the Energy Dissipation of VLSI Circuits. [Citation Graph (0, 0)][DBLP]
    PATMOS, 2003, pp:481-490 [Conf]
  7. E. Isern, M. Roca, J. Segura
    Analyzing the Need for ATPG Targeting GOS Defects. [Citation Graph (0, 0)][DBLP]
    VTS, 1999, pp:420-425 [Conf]
  8. Eugeni Isern, Joan Figueras
    IDDQ Test and Diagnosis of CMOS Circuits. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1995, v:12, n:4, pp:60-67 [Journal]
  9. Antoni Ferré, Eugeni Isern, Josep Rius, Rosa Rodríguez-Montañés, Joan Figueras
    IDDQ testing: state of the art and future trends. [Citation Graph (0, 0)][DBLP]
    Integration, 1998, v:26, n:1-2, pp:167-196 [Journal]
  10. Francesc Moll, Miquel Roca, Eugeni Isern
    Analysis of dissipation energy of switching digital CMOS gates with coupled outputs. [Citation Graph (0, 0)][DBLP]
    Microelectronics Journal, 2003, v:34, n:9, pp:833-842 [Journal]

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