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Edward B. Eichelberger:
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- Edward B. Eichelberger
Sequential circuit synthesis using input delays [Citation Graph (0, 0)][DBLP] FOCS, 1963, pp:105-116 [Conf]
- Edward B. Eichelberger
Hazard detection in combinational and sequential switching circuits [Citation Graph (0, 0)][DBLP] FOCS, 1964, pp:111-120 [Conf]
- Edward B. Eichelberger
Experiences and Expectations in VLSI Testing. [Citation Graph (0, 0)][DBLP] ITC, 1985, pp:4- [Conf]
- Franco Motika, John A. Waicukauski, Edward B. Eichelberger, Eric Lindbloom
An LSSD Pseudo Random Pattern Test System. [Citation Graph (0, 0)][DBLP] ITC, 1983, pp:283-288 [Conf]
- John A. Waicukauski, Eric Lindbloom, Edward B. Eichelberger, Donato O. Forlenza, Tim McCarthy
A Statistical Calculation of Fault Detection Probabilities By Fast Fault Simulation. [Citation Graph (0, 0)][DBLP] ITC, 1985, pp:779-784 [Conf]
- Edward B. Eichelberger, Eric Lindbloom
Random-Pattern Coverage Enhancement and Diagnosis for LSSD Logic Self-Test. [Citation Graph (0, 0)][DBLP] IBM Journal of Research and Development, 1983, v:27, n:3, pp:265-272 [Journal]
- Edward B. Eichelberger, Eric Lindbloom
A Heuristic Test-Pattern Generator for Programmable Logic Arrays. [Citation Graph (0, 0)][DBLP] IBM Journal of Research and Development, 1980, v:24, n:1, pp:15-22 [Journal]
- John A. Waicukauski, Eric Lindbloom, Edward B. Eichelberger, Orazio P. Forlenza
A Method for Generating Weighted Random Test Patterns. [Citation Graph (0, 0)][DBLP] IBM Journal of Research and Development, 1989, v:33, n:2, pp:149-161 [Journal]
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