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Publications of Author

1. Kaiyuan Huang, Vinod K. Agarwal, Laurence E. LaForge
   Wafer Testing with Pairwise Comparisons. [Citation Graph (0, 0)][DBLP]
   FTCS, 1992, pp:374-383 [Conf]
   
2. Krishnaiyan Thulasiraman, Anindya Das, Kaiyuan Huang, Vinod K. Agarwal
   Correct diagnosis of almost all faulty units in a multiprocessor system. [Citation Graph (0, 0)][DBLP]
   ISCAS (6), 1999, pp:161-164 [Conf]
   
3. Krishnaiyan Thulasiraman, Anindya Das, Kaiyuan Huang, Vinod K. Agarwal
   Correct Diagnosis of Almost All Faulty Units in a Multiprocessor System. [Citation Graph (0, 0)][DBLP]
   Journal of Circuits, Systems, and Computers, 1998, v:8, n:4, pp:473-481 [Journal]
   
4. Kaiyuan Huang, Tinghuai Chen
   On the Diagnosis of System Faults with Propagation. [Citation Graph (0, 0)][DBLP]
   IEEE Trans. Computers, 1986, v:35, n:12, pp:1082-1086 [Journal]
   
5. Laurence E. LaForge, Kaiyuan Huang, Vinod K. Agarwal
   Almost Sure Diagnosis of Almost Every Good Element. [Citation Graph (0, 0)][DBLP]
   IEEE Trans. Computers, 1994, v:43, n:3, pp:295-305 [Journal]
   
6. Kaiyuan Huang, Vinod K. Agarwal, Krishnaiyan Thulasiraman
   Diagnosis of clustered faults and wafer testing. [Citation Graph (0, 0)][DBLP]
   IEEE Trans. on CAD of Integrated Circuits and Systems, 1998, v:17, n:2, pp:136-148 [Journal]
   
7. Kaiyuan Huang, Vinod K. Agarwal, Laurence E. LaForge, Krishnaiyan Thulasiraman
   A Diagnosis Algorithm for Constant Degree Structures and Its Application to VLSI Circuit Testing. [Citation Graph (0, 0)][DBLP]
   IEEE Trans. Parallel Distrib. Syst., 1995, v:6, n:4, pp:363-372 [Journal]