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Publications of Author

1. Nirmal R. Saxena, Piero Franco, Edward J. McCluskey
   Bounds on Signature Analysis Aliasing for Random Testing. [Citation Graph (0, 0)][DBLP]
   FTCS, 1991, pp:104-113 [Conf]
   
2. Piero Franco, William D. Farwell, Robert L. Stokes, Edward J. McCluskey
   An Experimental Chip to Evaluate Test Techniques: Chip and Experiment Design. [Citation Graph (0, 0)][DBLP]
   ITC, 1995, pp:653-662 [Conf]
   
3. Piero Franco, Edward J. McCluskey
   Delay Testing of Digital Circuits by Output Waveform Analysis. [Citation Graph (0, 0)][DBLP]
   ITC, 1991, pp:798-807 [Conf]
   
4. Piero Franco, Siyad C. Ma, Jonathan Chang, Yi-Chin Chu, Sanjay Wattal, Edward J. McCluskey, Robert L. Stokes, William D. Farwell
   Analysis and Detection of Timing Failures in an Experimental Test Chip. [Citation Graph (0, 0)][DBLP]
   ITC, 1996, pp:691-700 [Conf]
   
5. Siyad C. Ma, Piero Franco, Edward J. McCluskey
   An Experimental Chip to Evaluate Test Techniques: Experiment Results. [Citation Graph (0, 0)][DBLP]
   ITC, 1995, pp:663-672 [Conf]
   
6. Nirmal R. Saxena, Piero Franco, Edward J. McCluskey
   Refined Bounds on Signature Analysis Aliasing for Random Testing. [Citation Graph (0, 0)][DBLP]
   ITC, 1991, pp:818-827 [Conf]
   
7. Nirmal R. Saxena, Piero Franco, Edward J. McCluskey
   Simple Bounds on Serial Signature Analysis Aliasing for Random Testing. [Citation Graph (0, 0)][DBLP]
   IEEE Trans. Computers, 1992, v:41, n:5, pp:638-645 [Journal]