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Ji Hwan (Paul) Chun: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Ji Hwan (Paul) Chun, Hak-soo Yu, Jacob A. Abraham
    An efficient linearity test for on-chip high speed ADC and DAC using loop-back. [Citation Graph (0, 0)][DBLP]
    ACM Great Lakes Symposium on VLSI, 2004, pp:328-331 [Conf]
  2. Ashwin Raghunathan, Ji Hwan (Paul) Chun, Jacob A. Abraham, Abhijit Chatterjee
    Quasi-Oscillation Based Test for Improved Prediction of Analog Performance Parameters. [Citation Graph (0, 0)][DBLP]
    ITC, 2004, pp:252-261 [Conf]
  3. Hak-soo Yu, Hongjoong Shin, Ji Hwan (Paul) Chun, Jacob A. Abraham
    Performance Characterization of Mixed-Signal Circuits Using a Ternary Signal Representation. [Citation Graph (0, 0)][DBLP]
    ITC, 2004, pp:1389-1397 [Conf]
  4. Byoungho Kim, Hongjoong Shin, Ji Hwan (Paul) Chun, Jacob A. Abraham
    Optimized Signature-Based Statistical Alternate Test for Mixed-Signal Performance Parameters. [Citation Graph (0, 0)][DBLP]
    European Test Symposium, 2006, pp:199-204 [Conf]

  5. A Random Jitter RMS Estimation Technique for BIST Applications. [Citation Graph (, )][DBLP]


  6. A delay measurement method using a shrinking clock signal. [Citation Graph (, )][DBLP]


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