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Mary Yvonne Lanzerotti:
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- Gerald G. Lopez, Giovanni Fiorenza, Thomas J. Bucelot, Phillip Restle, Mary Yvonne Lanzerotti
Characterization of the impact of interconnect design on the capacitive load driven by a global clock distribution. [Citation Graph (0, 0)][DBLP] ACM Great Lakes Symposium on VLSI, 2005, pp:38-43 [Conf]
- Mary Yvonne Lanzerotti, Giovanni Fiorenza, Rick A. Rand
Predicting interconnect requirements in ultra-large-scale integrated control logic circuitry. [Citation Graph (0, 0)][DBLP] SLIP, 2005, pp:43-50 [Conf]
- Mary Yvonne Lanzerotti, Giovanni Fiorenza, Rick A. Rand
Microminiature packaging and integrated circuitry: The work of E. F. Rent, with an application to on-chip interconnection requirements. [Citation Graph (0, 0)][DBLP] IBM Journal of Research and Development, 2005, v:49, n:4-5, pp:777-803 [Journal]
- Mary Yvonne Lanzerotti, Giovanni Fiorenza, Rick A. Rand
Assessment of on-chip wire-length distribution models. [Citation Graph (0, 0)][DBLP] IEEE Trans. VLSI Syst., 2004, v:12, n:10, pp:1108-1112 [Journal]
- Mary Yvonne Lanzerotti, Giovanni Fiorenza, Rick A. Rand
Interpretation of rent's rule for ultralarge-scale integrated circuit designs, with an application to wirelength distribution models. [Citation Graph (0, 0)][DBLP] IEEE Trans. VLSI Syst., 2004, v:12, n:12, pp:1330-1347 [Journal]
- Mary Yvonne Lanzerotti, Giovanni Fiorenza, Rick A. Rand
Impact of interconnect length changes on effective materials properties (dielectric constant). [Citation Graph (0, 0)][DBLP] SLIP, 2007, pp:73-80 [Conf]
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