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Publications of Author

1. Haralampos-G. D. Stratigopoulos, Yiorgos Makris
   Generating decision regions in analog measurement spaces. [Citation Graph (0, 0)][DBLP]
   ACM Great Lakes Symposium on VLSI, 2005, pp:88-91 [Conf]
   
2. Haralampos-G. D. Stratigopoulos, Yiorgos Makris
   An Analog Checker With Input-Relative Tolerance for Duplicate Signals. [Citation Graph (0, 0)][DBLP]
   IOLTS, 2003, pp:54-0 [Conf]
   
3. Haralampos-G. D. Stratigopoulos, Yiorgos Makris
   Concurrent Error Detection in Linear Analog Circuits Using State Estimation. [Citation Graph (0, 0)][DBLP]
   ITC, 2003, pp:1164-1173 [Conf]
   
4. Haralampos-G. D. Stratigopoulos, Yiorgos Makris
   An Analog Checker with Dynamically Adjustable Error Threshold for Fully Differential Circuits. [Citation Graph (0, 0)][DBLP]
   VTS, 2003, pp:209-218 [Conf]
   
5. Haralampos-G. D. Stratigopoulos, Yiorgos Makris
   Constructive Derivation of Analog Specification Test Criteria. [Citation Graph (0, 0)][DBLP]
   VTS, 2005, pp:395-400 [Conf]
   
6. Haralampos-G. D. Stratigopoulos, Yiorgos Makris
   Bridging the Accuracy of Functional and Machine-Learning-Based Mixed-Signal Testing. [Citation Graph (0, 0)][DBLP]
   VTS, 2006, pp:406-411 [Conf]
   
7. Haralampos-G. D. Stratigopoulos, Petros Drineas, Mustapha Slamani, Yiorgos Makris
   Non-RF to RF Test Correlation Using Learning Machines: A Case Study. [Citation Graph (0, 0)][DBLP]
   VTS, 2007, pp:9-14 [Conf]
   
8. Haralampos-G. D. Stratigopoulos, Yiorgos Makris
   Nonlinear decision boundaries for testing analog circuits. [Citation Graph (0, 0)][DBLP]
   IEEE Trans. on CAD of Integrated Circuits and Systems, 2005, v:24, n:11, pp:1760-1773 [Journal]
   
9. Haralampos-G. D. Stratigopoulos, Yiorgos Makris
   Concurrent detection of erroneous responses in linear analog circuits. [Citation Graph (0, 0)][DBLP]
   IEEE Trans. on CAD of Integrated Circuits and Systems, 2006, v:25, n:5, pp:878-891 [Journal]
   
10. 
    A General Method to Evaluate RF BIST Techniques Based on Non-parametric Density Estimation. [Citation Graph (, )][DBLP]
    
    
11. 
    Enrichment of limited training sets in machine-learning-based analog/RF test. [Citation Graph (, )][DBLP]
    
    
12. 
    Fault diagnosis of analog circuits based on machine learning. [Citation Graph (, )][DBLP]
    
    
13. 
    A Statistical Approach to Characterizing and Testing Functionalized Nanowires. [Citation Graph (, )][DBLP]
    
    
14. 
    Sensors for built-in alternate RF test. [Citation Graph (, )][DBLP]
    
    
15. 
    Defect filter for alternate RF test. [Citation Graph (, )][DBLP]
    
    
16. 
    Defect Filter for Alternate RF Test. [Citation Graph (, )][DBLP]