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Mohammad Athar Khalil: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Chin-Long Wey, Mohammad Athar Khalil, Jim Liu, Gregory Wierzba
    Hierarchical extreme-voltage stress test of analog CMOS ICs for gate-oxide reliability enhancement. [Citation Graph (0, 0)][DBLP]
    ACM Great Lakes Symposium on VLSI, 2004, pp:322-327 [Conf]
  2. Mohammad Athar Khalil, Chin-Long Wey
    Extreme-voltage stress vector generation of analog CMOS ICs for gate-oxide reliability enhancement. [Citation Graph (0, 0)][DBLP]
    ITC, 2001, pp:348-357 [Conf]
  3. Mohammad Athar Khalil, Chin-Long Wey
    High-Voltage Stress Test Paradigms of Analog CMOS ICs for Gate-Oxide Reliability Enhancement. [Citation Graph (0, 0)][DBLP]
    VTS, 2001, pp:333-338 [Conf]

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