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Jim Liu: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Chin-Long Wey, Mohammad Athar Khalil, Jim Liu, Gregory Wierzba
    Hierarchical extreme-voltage stress test of analog CMOS ICs for gate-oxide reliability enhancement. [Citation Graph (0, 0)][DBLP]
    ACM Great Lakes Symposium on VLSI, 2004, pp:322-327 [Conf]

  2. On the feasibility of using servo-mechanisms in wireless multimedia sensor network deployments. [Citation Graph (, )][DBLP]


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