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Younes Boulghassoul: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Riaz Naseer, Jeff Draper, Younes Boulghassoul, Sandeepan DasGupta, Art Witulski
    Critical charge and set pulse widths for combinational logic in commercial 90nm cmos technology. [Citation Graph (0, 0)][DBLP]
    ACM Great Lakes Symposium on VLSI, 2007, pp:227-230 [Conf]
  2. Riaz Naseer, Younes Boulghassoul, Jeff Draper, Sandeepan DasGupta, Art Witulski
    Critical Charge Characterization for Soft Error Rate Modeling in 90nm SRAM. [Citation Graph (0, 0)][DBLP]
    ISCAS, 2007, pp:1879-1882 [Conf]

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