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Karim Arabi: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Karim Arabi, Bozena Kaminska, Janusz Rzeszut
    A new built-in self-test approach for digital-to-analog and analog-to-digital converters. [Citation Graph (0, 0)][DBLP]
    ICCAD, 1994, pp:491-494 [Conf]
  2. Bozena Kaminska, Karim Arabi
    Mixed Signal DFT: A Concise Overview. [Citation Graph (0, 0)][DBLP]
    ICCAD, 2003, pp:672-680 [Conf]
  3. Karim Arabi, Bozena Kaminska
    Built-In Temperature Sensors for On-line Thermal Monitoring of Microelectronic Structures. [Citation Graph (0, 0)][DBLP]
    ICCD, 1997, pp:462-467 [Conf]
  4. Karim Arabi, Bozena Kaminska, Stephen K. Sunter
    Design for testability of integrated operational amplifiers using oscillation-test strategy. [Citation Graph (0, 0)][DBLP]
    ICCD, 1996, pp:40-45 [Conf]
  5. Jieyan Zhu, Mohamad Sawan, Karim Arabi
    An Offset Compensated CMOS Current-Feedback Operational-Amplifier. [Citation Graph (0, 0)][DBLP]
    ISCAS, 1995, pp:1552-1555 [Conf]
  6. Mohammad H. Tehranipour, Mehrdad Nourani, Karim Arabi, Ali Afzali-Kusha
    Mixed RL-Huffman encoding for power reduction and data compression in scan test. [Citation Graph (0, 0)][DBLP]
    ISCAS (2), 2004, pp:681-684 [Conf]
  7. Xiongfei Meng, Resve A. Saleh, Karim Arabi
    Novel Decoupling Capacitor Designs for sub- 90nm CMOS Technology. [Citation Graph (0, 0)][DBLP]
    ISQED, 2006, pp:266-271 [Conf]
  8. Karim Arabi
    Mixed-Signal BIST: Fact or Fiction. [Citation Graph (0, 0)][DBLP]
    ITC, 2002, pp:1202- [Conf]
  9. Karim Arabi, Hassan Ihs, Christian Dufaza, Bozena Kaminska
    Digital oscillation-test method for delay and stuck-at fault testing of digital circuits. [Citation Graph (0, 0)][DBLP]
    ITC, 1998, pp:91-100 [Conf]
  10. Karim Arabi, Bozena Kaminska
    Design and Realization of an Accurate Built-In Current Sensor for On-Line Power Dissipation Measurement and IDDQ Testing. [Citation Graph (0, 0)][DBLP]
    ITC, 1997, pp:578-586 [Conf]
  11. Karim Arabi, Bozena Kaminska
    Oscillation Built-In Self Test (OBIST) Scheme for Functional and Structural Testing of Analog and Mixed-Signal Integrated Circuits. [Citation Graph (0, 0)][DBLP]
    ITC, 1997, pp:786-795 [Conf]
  12. Francisco DaSilva, Yervant Zorian, Lee Whetsel, Karim Arabi, Rohit Kapur
    Overview of the IEEE P1500 Standard. [Citation Graph (0, 0)][DBLP]
    ITC, 2003, pp:988-997 [Conf]
  13. Bozena Kaminska, Karim Arabi, I. Bell, José L. Huertas, B. Kim, Adoración Rueda, Mani Soma, Prashant Goteti
    Analog and Mixed-Signal Benchmark Circuits-First Release. [Citation Graph (0, 0)][DBLP]
    ITC, 1997, pp:183-190 [Conf]
  14. Karim Arabi
    Logic BIST and Scan Test Techniques for Multiple Identical Blocks. [Citation Graph (0, 0)][DBLP]
    VTS, 2002, pp:60-68 [Conf]
  15. Karim Arabi, Klaus-Dieter Hilliges, David C. Keezer, Sassan Tabatabaei
    Multi-GigaHertz Testing Challenges and Solutions. [Citation Graph (0, 0)][DBLP]
    VTS, 2002, pp:265-268 [Conf]
  16. Karim Arabi, Bozena Kaminska
    Oscillation-test strategy for analog and mixed-signal integrated circuits. [Citation Graph (0, 0)][DBLP]
    VTS, 1996, pp:476-482 [Conf]
  17. Karim Arabi, Bozena Kaminska
    Parametric and Catastrophic Fault Coverage of Analog Circuits in Oscillation-Test Methodology. [Citation Graph (0, 0)][DBLP]
    VTS, 1997, pp:166-171 [Conf]
  18. Mehdi Ehsanian, Bozena Kaminska, Karim Arabi
    A new digital test approach for analog-to-digital converter testing. [Citation Graph (0, 0)][DBLP]
    VTS, 1996, pp:60-65 [Conf]
  19. Karim Arabi, Bozena Kaminska, Janusz Rzeszut
    BIST for D/A and A/D Converters. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1996, v:13, n:4, pp:40-49 [Journal]
  20. Karim Arabi, Bozena Kaminska
    Testing analog and mixed-signal integrated circuits using oscillation-test method. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 1997, v:16, n:7, pp:745-753 [Journal]
  21. Xiongfei Meng, Karim Arabi, Resve Saleh
    A Novel Active Decoupling Capacitor Design in 90nm CMOS. [Citation Graph (0, 0)][DBLP]
    ISCAS, 2007, pp:657-660 [Conf]
  22. Karim Arabi, Bozena Kaminska, Mohamad Sawan
    On chip testing data converters using static parameters. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. VLSI Syst., 1998, v:6, n:3, pp:409-419 [Journal]

  23. Efficient and accurate testing of analog-to-digital converters using oscillation-test method. [Citation Graph (, )][DBLP]

  24. Power Supply Noise in SoCs: Metrics, Management, and Measurement. [Citation Graph (, )][DBLP]

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