Search the dblp DataBase

Publications of Author

1. Soo Young Lee, Kewal K. Saluja
   An algorithm to reduce test application time in full scan designs. [Citation Graph (0, 0)][DBLP]
   ICCAD, 1992, pp:17-20 [Conf]
   
2. Soo Young Lee, Kewal K. Saluja
   Efficient Test Vectors for ISCAS Sequential Benchmark Circuits. [Citation Graph (0, 0)][DBLP]
   ISCAS, 1993, pp:1511-1514 [Conf]
   
3. Todd P. Kelsey, Kewal K. Saluja, Soo Young Lee
   An Efficient Algorithm for Sequential Circuit Test Generation. [Citation Graph (0, 0)][DBLP]
   IEEE Trans. Computers, 1993, v:42, n:11, pp:1361-1371 [Journal]
   
4. Soo Young Lee, Kewal K. Saluja
   Test application time reduction for sequential circuits with scan. [Citation Graph (0, 0)][DBLP]
   IEEE Trans. on CAD of Integrated Circuits and Systems, 1995, v:14, n:9, pp:1128-1140 [Journal]
   
5. 
   Performance Improvement of Fault Tolerant CORBA Based Intelligent Transportation Systems (ITS) with an Autonomous Agent. [Citation Graph (, )][DBLP]