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Ashok Balivada: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Naveena Nagi, Abhijit Chatterjee, Ashok Balivada, Jacob A. Abraham
    Fault-based automatic test generator for linear analog circuits. [Citation Graph (0, 0)][DBLP]
    ICCAD, 1993, pp:88-91 [Conf]
  2. Naveena Nagi, Abhijit Chatterjee, Ashok Balivada, Jacob A. Abraham
    Efficient multisine testing of analog circuits. [Citation Graph (0, 0)][DBLP]
    VLSI Design, 1995, pp:234-238 [Conf]
  3. Ashok Balivada, Yatin Vasant Hoskote, Jacob A. Abraham
    Verification of transient response of linear analog circuits. [Citation Graph (0, 0)][DBLP]
    VTS, 1995, pp:42-47 [Conf]
  4. Hong Helena Zheng, Ashok Balivada, Jacob A. Abraham
    A novel test generation approach for parametric faults in linear analog circuits . [Citation Graph (0, 0)][DBLP]
    VTS, 1996, pp:470-475 [Conf]
  5. Ashok Balivada, Jin Chen, Jacob A. Abraham
    Analog Testing with Time Response Parameters. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1996, v:13, n:2, pp:18-25 [Journal]

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