The SCEAS System
Navigation Menu

Search the dblp DataBase

Title:
Author:

Ashok Balivada: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Naveena Nagi, Abhijit Chatterjee, Ashok Balivada, Jacob A. Abraham
    Fault-based automatic test generator for linear analog circuits. [Citation Graph (0, 0)][DBLP]
    ICCAD, 1993, pp:88-91 [Conf]
  2. Naveena Nagi, Abhijit Chatterjee, Ashok Balivada, Jacob A. Abraham
    Efficient multisine testing of analog circuits. [Citation Graph (0, 0)][DBLP]
    VLSI Design, 1995, pp:234-238 [Conf]
  3. Ashok Balivada, Yatin Vasant Hoskote, Jacob A. Abraham
    Verification of transient response of linear analog circuits. [Citation Graph (0, 0)][DBLP]
    VTS, 1995, pp:42-47 [Conf]
  4. Hong Helena Zheng, Ashok Balivada, Jacob A. Abraham
    A novel test generation approach for parametric faults in linear analog circuits . [Citation Graph (0, 0)][DBLP]
    VTS, 1996, pp:470-475 [Conf]
  5. Ashok Balivada, Jin Chen, Jacob A. Abraham
    Analog Testing with Time Response Parameters. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1996, v:13, n:2, pp:18-25 [Journal]

Search in 0.002secs, Finished in 0.002secs
NOTICE1
System may not be available sometimes or not working properly, since it is still in development with continuous upgrades
NOTICE2
The rankings that are presented on this page should NOT be considered as formal since the citation info is incomplete in DBLP
 
System created by asidirop@csd.auth.gr [http://users.auth.gr/~asidirop/] © 2002
for Data Engineering Laboratory, Department of Informatics, Aristotle University © 2002