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Title:
Author:
Gordon W. Roberts: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Gordon W. Roberts
    Metrics, techniques and recent developments in mixed-signal testing. [Citation Graph (0, 0)][DBLP]
    ICCAD, 1996, pp:514-521 [Conf]
  2. P. J. Crawley, Gordon W. Roberts
    Predicting Harmonic Distortion in Switched-current Memory Circuits. [Citation Graph (0, 0)][DBLP]
    ISCAS, 1993, pp:1243-1250 [Conf]
  3. P. J. Crawley, Gordon W. Roberts
    Designing Operational Transconductance Amplifiers for Low Voltage Operation. [Citation Graph (0, 0)][DBLP]
    ISCAS, 1993, pp:1455-1458 [Conf]
  4. Christian Jesús B. Fayomi, Gordon W. Roberts, Mohamad Sawan
    Low-voltage CMOS analog bootstrapped switch for sample-and-hold circuit: design and chip characterization. [Citation Graph (0, 0)][DBLP]
    ISCAS (3), 2005, pp:2200-2203 [Conf]
  5. Peter M. Levine, Gordon W. Roberts
    A calibration technique for a high-resolution flash time-to-digital converter. [Citation Graph (0, 0)][DBLP]
    ISCAS (1), 2004, pp:253-256 [Conf]
  6. A. K. Lu, Gordon W. Roberts, David A. Johns
    A High-Quality Analog Oscillator Using Oversampling D/A Conversion Techniques. [Citation Graph (0, 0)][DBLP]
    ISCAS, 1993, pp:1298-1301 [Conf]
  7. Morie E. Malowany, Gordon W. Roberts, Vinod K. Agarwal
    VAMP: A Hierarchical Framework for Design for Manufacturability. [Citation Graph (0, 0)][DBLP]
    ISCAS, 1994, pp:141-144 [Conf]
  8. Mourad Oulmane, Gordon W. Roberts
    A CMOS time amplifier for Femto-second resolution timing measurement. [Citation Graph (0, 0)][DBLP]
    ISCAS (1), 2004, pp:509-512 [Conf]
  9. D. Perry, Gordon W. Roberts
    Log-Domain Filters Based on LC Ladder Synthesis. [Citation Graph (0, 0)][DBLP]
    ISCAS, 1995, pp:311-314 [Conf]
  10. Gordon W. Roberts
    Calculating Distortion Levels in Sampled-Data Circuits Using SPICE. [Citation Graph (0, 0)][DBLP]
    ISCAS, 1995, pp:2059-2062 [Conf]
  11. Peter M. Sinn, Gordon W. Roberts
    A Comparison of First and Second Generation Switched-Current Cells. [Citation Graph (0, 0)][DBLP]
    ISCAS, 1994, pp:301-304 [Conf]
  12. I. Song, Gordon W. Roberts
    A 5th Order Bilinear Switched-current Chebyshev Filter. [Citation Graph (0, 0)][DBLP]
    ISCAS, 1993, pp:1097-1100 [Conf]
  13. C. K. L. Tam, Gordon W. Roberts
    A DC current measurement circuit for on-chip applications. [Citation Graph (0, 0)][DBLP]
    ISCAS (1), 2003, pp:101-104 [Conf]
  14. M. F. Toner, Gordon W. Roberts
    Towards Built-In-Self-Test for SNR Testing of a Mixed-Signal IC. [Citation Graph (0, 0)][DBLP]
    ISCAS, 1993, pp:1599-1602 [Conf]
  15. Benoît R. Veillette, Gordon W. Roberts
    Bandpass Signal Generation Using Delta-Sigma Modulation Techniques. [Citation Graph (0, 0)][DBLP]
    ISCAS, 1995, pp:637-640 [Conf]
  16. C. K. L. Tam, Gordon W. Roberts
    A robust DC current generation and measurement technique for deep submicron circuits. [Citation Graph (0, 0)][DBLP]
    ISCAS (1), 2001, pp:719-722 [Conf]
  17. G. D. Duerden, Gordon W. Roberts, M. Jamal Deen
    The development of bipolar log domain filters in a standard CMOS process. [Citation Graph (0, 0)][DBLP]
    ISCAS (1), 2001, pp:145-148 [Conf]
  18. Christian Jesús B. Fayomi, Mohamad Sawan, Gordon W. Roberts
    A design strategy for a 1-V rail-to-rail input/output CMOS opamp. [Citation Graph (0, 0)][DBLP]
    ISCAS (1), 2001, pp:639-642 [Conf]
  19. A. Aga, Gordon W. Roberts
    A CMOS digitally programmable current steering semidigital FIR reconstruction filter. [Citation Graph (0, 0)][DBLP]
    ISCAS (1), 2001, pp:168-171 [Conf]
  20. Christian Jesús B. Fayomi, Gordon W. Roberts, Mohamad Sawan
    A 1-V, 10-bit rail-to-rail successive approximation analog-to-digital converter in standard 0.18 um CMOS technology. [Citation Graph (0, 0)][DBLP]
    ISCAS (1), 2001, pp:460-463 [Conf]
  21. N. Chandra, Gordon W. Roberts
    Top-down analog design methodology using Matlab and Simulink. [Citation Graph (0, 0)][DBLP]
    ISCAS (5), 2001, pp:319-322 [Conf]
  22. Nazmy Abaskharoun, Mohamed Hafed, Gordon W. Roberts
    Strategies for on-chip sub-nanosecond signal capture and timing measurements. [Citation Graph (0, 0)][DBLP]
    ISCAS (4), 2001, pp:174-177 [Conf]
  23. Mourad N. El-Gamal, Gordon W. Roberts
    A 1.2 V NPN-only log-domain integrator. [Citation Graph (0, 0)][DBLP]
    ISCAS (2), 1999, pp:681-684 [Conf]
  24. Sebastien Laberge, Gordon W. Roberts
    Temperature compensated CMOS voltage reference. [Citation Graph (0, 0)][DBLP]
    ISCAS (1), 2002, pp:717-720 [Conf]
  25. Bardia Pishdad, Gordon W. Roberts
    A 10-bit 1 MS/s 3-step ADC with bitstream-based sub-DAC and sub-ADC calibration. [Citation Graph (0, 0)][DBLP]
    ISCAS (1), 2002, pp:501-504 [Conf]
  26. Antonio H. Chan, Gordon W. Roberts
    A synthesizable, fast and high-resolution timing measurement device using a component-invariant vernier delay line. [Citation Graph (0, 0)][DBLP]
    ITC, 2001, pp:858-867 [Conf]
  27. Benoit Dufort, Gordon W. Roberts
    Signal Generation Using Periodic Single-and Multi-Bit Sigma-Delta Modulated Streams. [Citation Graph (0, 0)][DBLP]
    ITC, 1997, pp:396-405 [Conf]
  28. Benoit Dufort, Gordon W. Roberts
    Increasing the performance of arbitrary waveform generators using sigma-delta coding techniques. [Citation Graph (0, 0)][DBLP]
    ITC, 1998, pp:241-248 [Conf]
  29. Mohamed Hafed, Nazmy Abaskharoun, Gordon W. Roberts
    A stand-alone integrated test core for time and frequency domain measurements. [Citation Graph (0, 0)][DBLP]
    ITC, 2000, pp:1031-1040 [Conf]
  30. Mohamed Hafed, Nazmy Abaskharoun, Gordon W. Roberts
    A stand-alone integrated test core for time and frequency domain measurements. [Citation Graph (0, 0)][DBLP]
    ITC, 2001, pp:1190-1199 [Conf]
  31. Mohamed Hafed, Antonio H. Chan, Geoffrey Duerden, Bardia Pishdad, Clarence Tam, Sebastien Laberge, Gordon W. Roberts
    A High-Throughput 5 GBps Timing and Jitter Test Module Featuring Localized Processing. [Citation Graph (0, 0)][DBLP]
    ITC, 2004, pp:728-737 [Conf]
  32. Mohamed Hafed, Gordon W. Roberts
    Test and Evaluation of Multiple Embedded Mixed-Signal Test Cores. [Citation Graph (0, 0)][DBLP]
    ITC, 2002, pp:1022-1030 [Conf]
  33. Ara Hajjar, Gordon W. Roberts
    A high speed and area efficient on-chip analog waveform extractor. [Citation Graph (0, 0)][DBLP]
    ITC, 1998, pp:688-697 [Conf]
  34. Xavier Haurie, Gordon W. Roberts
    Arbitrary-Precision Signal Generation for Bandlimited Mixed-Signal Testing. [Citation Graph (0, 0)][DBLP]
    ITC, 1995, pp:78-86 [Conf]
  35. Evan M. Hawrysh, Gordon W. Roberts
    An Integration of Memory-Based Analog Signal Generation into Current DFT Architectures. [Citation Graph (0, 0)][DBLP]
    ITC, 1996, pp:528-537 [Conf]
  36. A. K. Lu, Gordon W. Roberts
    An Analog Multi-Tone Signal Generator for Built-In Self-Test Applications. [Citation Graph (0, 0)][DBLP]
    ITC, 1994, pp:650-659 [Conf]
  37. Peter M. Levine, Gordon W. Roberts
    A High-Resolution Flash Time-to-Digital Converter and Calibration Scheme. [Citation Graph (0, 0)][DBLP]
    ITC, 2004, pp:1148-1157 [Conf]
  38. Gordon W. Roberts
    Mixed-Signal BIST: Fact or Fiction. [Citation Graph (0, 0)][DBLP]
    ITC, 2002, pp:1204- [Conf]
  39. Gordon W. Roberts
    Re-examining the Needs of the Mixed-Signal Test. [Citation Graph (0, 0)][DBLP]
    ITC, 1995, pp:298- [Conf]
  40. M. F. Toner, Gordon W. Roberts
    A BIST Scheme for an SNR Test of a Sigma-Delta ADC. [Citation Graph (0, 0)][DBLP]
    ITC, 1993, pp:805-814 [Conf]
  41. Christopher S. Taillefer, Gordon W. Roberts
    Reducing Measurement Uncertainty in a DSP-Based Mixed-Signal Test Environment without Increasing Test Time. [Citation Graph (0, 0)][DBLP]
    ITC, 2004, pp:953-962 [Conf]
  42. Benoît R. Veillette, Gordon W. Roberts
    A Bulti-in Self-Test Strategy for Wireless Communication Systems. [Citation Graph (0, 0)][DBLP]
    ITC, 1995, pp:930-939 [Conf]
  43. Benoît R. Veillette, Gordon W. Roberts
    On-Chip Measurement of the Jitter Transfer Function of Charge-Pump Phase-Locked Loops. [Citation Graph (0, 0)][DBLP]
    ITC, 1997, pp:776-785 [Conf]
  44. Benoît R. Veillette, Gordon W. Roberts
    Stimulus generation for built-in self-test of charge-pump phase-locked loops. [Citation Graph (0, 0)][DBLP]
    ITC, 1998, pp:698-0 [Conf]
  45. Robert C. Aitken, Gordon W. Roberts
    ITC 2003: Breaking Test Interface Bottlenecks. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2003, v:20, n:5, pp:54-0 [Journal]
  46. Gordon W. Roberts, Robert C. Aitken
    ITC Highlights. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2003, v:20, n:5, pp:55-57 [Journal]
  47. Antonio H. Chan, Gordon W. Roberts
    A jitter characterization system using a component-invariant Vernier delay line. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. VLSI Syst., 2004, v:12, n:1, pp:79-95 [Journal]
  48. Christopher S. Taillefer, Gordon W. Roberts
    Reducing Measurement Uncertainty in a DSP-Based Mixed-Signal Test Environment Without Increasing Test Time. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. VLSI Syst., 2005, v:13, n:7, pp:852-860 [Journal]
  49. Christopher S. Taillefer, Gordon W. Roberts
    Delta-Sigma Analog-to-Digital Conversion via Time-Mode Signal Processing. [Citation Graph (0, 0)][DBLP]
    ISCAS, 2007, pp:13-16 [Conf]
  50. M. Safi-Harb, G. W. Roberts
    A CMOS circuit for embedded GHz measurement of digital signal rise time degradation. [Citation Graph (0, 0)][DBLP]
    ISCAS, 2006, pp:- [Conf]
  51. Christopher S. Taillefer, Gordon W. Roberts
    Process-insensitive modulated-clock voltage comparator. [Citation Graph (0, 0)][DBLP]
    ISCAS, 2006, pp:- [Conf]

  52. A metastability-independent time-to-voltage converter. [Citation Graph (, )][DBLP]


  53. Time-domain analog signal processing techniques. [Citation Graph (, )][DBLP]


  54. Test Methods For Sigma-Delta Data Converters and Related Devices. [Citation Graph (, )][DBLP]


  55. Mixed-Signal Production Test: A Measurement Principle Perspective. [Citation Graph (, )][DBLP]


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