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I. D. Dear:
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Publications of Author
- Chryssa Dislis, Anthony P. Ambler, I. D. Dear, J. H. Dick
Economics in Design and Test. [Citation Graph (0, 0)][DBLP] ICCD, 1993, pp:384-387 [Conf]
- Chryssa Dislis, J. H. Dick, I. D. Dear, I. N. Azu, Anthony P. Ambler
Economics Modelling for the Determination of Test Strategies for Complex VLSI Boards. [Citation Graph (0, 0)][DBLP] ITC, 1993, pp:210-217 [Conf]
- Chryssa Dislis, I. D. Dear, J. R. Miles, S. C. Lau, Anthony P. Ambler
Cost Analysis of Test Method Environments. [Citation Graph (0, 0)][DBLP] ITC, 1989, pp:875-883 [Conf]
- Mark Paraskeva, Anthony P. Ambler, D. F. Burrows, W. L. Knight, I. D. Dear
Economically Viable Automatic Insertion of Self-Test Features for Custom VLSI. [Citation Graph (0, 0)][DBLP] ITC, 1986, pp:232-243 [Conf]
- I. D. Dear, Chryssa Dislis, Anthony P. Ambler, J. H. Dick
Economic Effects in Design and Test. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 1991, v:8, n:4, pp:64-77 [Journal]
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