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I. D. Dear: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Chryssa Dislis, Anthony P. Ambler, I. D. Dear, J. H. Dick
    Economics in Design and Test. [Citation Graph (0, 0)][DBLP]
    ICCD, 1993, pp:384-387 [Conf]
  2. Chryssa Dislis, J. H. Dick, I. D. Dear, I. N. Azu, Anthony P. Ambler
    Economics Modelling for the Determination of Test Strategies for Complex VLSI Boards. [Citation Graph (0, 0)][DBLP]
    ITC, 1993, pp:210-217 [Conf]
  3. Chryssa Dislis, I. D. Dear, J. R. Miles, S. C. Lau, Anthony P. Ambler
    Cost Analysis of Test Method Environments. [Citation Graph (0, 0)][DBLP]
    ITC, 1989, pp:875-883 [Conf]
  4. Mark Paraskeva, Anthony P. Ambler, D. F. Burrows, W. L. Knight, I. D. Dear
    Economically Viable Automatic Insertion of Self-Test Features for Custom VLSI. [Citation Graph (0, 0)][DBLP]
    ITC, 1986, pp:232-243 [Conf]
  5. I. D. Dear, Chryssa Dislis, Anthony P. Ambler, J. H. Dick
    Economic Effects in Design and Test. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1991, v:8, n:4, pp:64-77 [Journal]

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