Search the dblp DataBase

Publications of Author

1. Hu Huang, Joseph B. Bernstein, Martin Peckerar, Ji Luo
   Combined Channel Segmentation and Buffer Insertion for Routability and Performance Improvement of Field. [Citation Graph (0, 0)][DBLP]
   ICCD, 2004, pp:490-495 [Conf]
   
2. Zhuo Gao, Ji Luo, Hu Huang, Wei Zhang, Joseph B. Bernstein
   Reliable Laser Programmable Gate Array Technology. [Citation Graph (0, 0)][DBLP]
   ISQED, 2002, pp:252-256 [Conf]
   
3. Xiaojun Li, Bing Huang, J. Qin, X. Zhang, Michael Talmor, Z. Gur, Joseph B. Bernstein
   Deep Submicron CMOS Integrated Circuit Reliability Simulation with SPICE. [Citation Graph (0, 0)][DBLP]
   ISQED, 2005, pp:382-389 [Conf]
   
4. Xiaojun Li, Joerg D. Walter, Joseph B. Bernstein
   Simulating and Improving Microelectronic Device Reliability by Scaling Voltage and Temperature. [Citation Graph (0, 0)][DBLP]
   ISQED, 2005, pp:496-502 [Conf]
   
5. Ji Luo, Joseph B. Bernstein, J. Ari Tuchman, Hu Huang, Kuan-Jung Chung, Anthony L. Wilson
   A High Performance Radiation-Hard Field Programmable Analog Array . [Citation Graph (0, 0)][DBLP]
   ISQED, 2004, pp:522-527 [Conf]
   
6. Bing Huang, Xiaojun Li, Ming Li, Joseph B. Bernstein, Carol Smidts
   Study of the Impact of Hardware Fault on Software Reliability. [Citation Graph (0, 0)][DBLP]
   ISSRE, 2005, pp:63-72 [Conf]
   
7. John S. Suehle, B. Zhu, Y. Chen, Joseph B. Bernstein
   Detailed study and projection of hard breakdown evolution in ultra-thin gate oxides. [Citation Graph (0, 0)][DBLP]
   Microelectronics Reliability, 2005, v:45, n:3-4, pp:419-426 [Journal]
   
8. Joseph B. Bernstein, Moshe Gurfinkel, Xiaojun Li, Jörg Walters, Yoram Shapira, Michael Talmor
   Electronic circuit reliability modeling. [Citation Graph (0, 0)][DBLP]
   Microelectronics Reliability, 2006, v:46, n:12, pp:1957-1979 [Journal]