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Publications of Author

1. Liyang Lai, Janak H. Patel, Thomas Rinderknecht, Wu-Tung Cheng
   Hardware Ef.cient LBISTWith Complementary Weights. [Citation Graph (0, 0)][DBLP]
   ICCD, 2005, pp:479-484 [Conf]
   
2. Liyang Lai, Janak H. Patel, Thomas Rinderknecht, Wu-Tung Cheng
   Logic BIST with Scan Chain Segmentation. [Citation Graph (0, 0)][DBLP]
   ITC, 2004, pp:57-66 [Conf]
   
3. Janusz Rajski, Nilanjan Mukherjee, Jerzy Tyszer, Thomas Rinderknecht
   Embedded Test for Low Cost Manufacturing. [Citation Graph (0, 0)][DBLP]
   VLSI Design, 2004, pp:21-23 [Conf]
   
4. Liyang Lai, Thomas Rinderknecht, Wu-Tung Cheng, Janak H. Patel
   Logic BIST Using Constrained Scan Cells. [Citation Graph (0, 0)][DBLP]
   VTS, 2004, pp:199-205 [Conf]
   
5. Xijiang Lin, Ron Press, Janusz Rajski, Paul Reuter, Thomas Rinderknecht, Bruce Swanson, Nagesh Tamarapalli
   High-Frequency, At-Speed Scan Testing. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 2003, v:20, n:5, pp:17-25 [Journal]
   
6. 
   ATPG Heuristics Dependant Observation Point Insertion for Enhanced Compaction and Data Volume Reduction. [Citation Graph (, )][DBLP]