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Author:
Scott Davidson: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Scott Davidson
    High level design automation tools (session overview). [Citation Graph (0, 0)][DBLP]
    ACM Conference on Computer Science, 1985, pp:73- [Conf]
  2. Bruce D. Shriver, Scott Davidson
    Firmware Engineering - Firmware Engineering. [Citation Graph (0, 0)][DBLP]
    Firmware Engineering, 1980, pp:25-71 [Conf]
  3. Scott Davidson
    What Can IC Test Teach System Test? [Citation Graph (0, 0)][DBLP]
    ITC, 2002, pp:1187- [Conf]
  4. Scott Davidson
    Fault Simulation at the Architectural Level. [Citation Graph (0, 0)][DBLP]
    ITC, 1984, pp:669-679 [Conf]
  5. Scott Davidson
    Is IDDQ Yield Loss Inevitable? [Citation Graph (0, 0)][DBLP]
    ITC, 1994, pp:572-579 [Conf]
  6. Scott Davidson
    ASIC jeopardy-diagnosing without a FAB. [Citation Graph (0, 0)][DBLP]
    ITC, 1998, pp:1136- [Conf]
  7. Scott Davidson
    Changing our Path to High Level ATPG. [Citation Graph (0, 0)][DBLP]
    ITC, 1999, pp:1114- [Conf]
  8. Scott Davidson
    ITC'99 Benchmark Circuits - Preliminary Results. [Citation Graph (0, 0)][DBLP]
    ITC, 1999, pp:1125- [Conf]
  9. Scott Davidson, James L. Lewandowski
    ESIM/AFS : A Concurrent Architectural Level Fault Simulator. [Citation Graph (0, 0)][DBLP]
    ITC, 1986, pp:375-385 [Conf]
  10. Ramesh C. Tekumalla, Scott Davidson
    On Identifying Indistinguishable Path Delay Faults and Improving Diagnosis. [Citation Graph (0, 0)][DBLP]
    ITC, 2002, pp:993-1002 [Conf]
  11. Michael G. Wahl, Sudipta Bhawmik, Kamran Zarrineh, Pradipta Ghosh, Scott Davidson, Peter Harrod
    The P1500 DFT Disclosure Document: A Standard to Communicate Mergeable Core DFT Data. [Citation Graph (0, 0)][DBLP]
    ITC, 2003, pp:998-1007 [Conf]
  12. S. Hwang, Rochit Rajsuman, Scott Davidson
    IDDQ Detection of CMOS Bridging Faults by Stuck-At Fault Tests. [Citation Graph (0, 0)][DBLP]
    VLSI Design, 1994, pp:183-186 [Conf]
  13. Magdy S. Abadir, Scott Davidson, Vijay Nagasamy, Dhiraj K. Pradhan, Prab Varma
    ATPG for Design Errors-Is It Possible? [Citation Graph (0, 0)][DBLP]
    VTS, 2001, pp:283-285 [Conf]
  14. Scott Davidson
    Towards an Understanding of No Trouble Found Devices. [Citation Graph (0, 0)][DBLP]
    VTS, 2005, pp:147-152 [Conf]
  15. José M. Miranda, Scott Davidson, Peter Dziel, Saman Adham, Steve Millman
    Test Reuse at System Level. [Citation Graph (0, 0)][DBLP]
    VTS, 1998, pp:318-319 [Conf]
  16. Chao-Wen Tseng, Subhasish Mitra, Edward J. McCluskey, Scott Davidson
    An Evaluation of Pseudo Random Testing for Detecting Real Defects. [Citation Graph (0, 0)][DBLP]
    VTS, 2001, pp:404-410 [Conf]
  17. Scott Davidson
    Guest Editor's Introduction: Software Tools for Hardware Tests. [Citation Graph (0, 0)][DBLP]
    IEEE Computer, 1989, v:22, n:4, pp:12-14 [Journal]
  18. David Landskov, Scott Davidson, Bruce Shriver, Patrick W. Mallett
    Local Microcode Compaction Techniques. [Citation Graph (0, 0)][DBLP]
    ACM Comput. Surv., 1980, v:12, n:3, pp:261-294 [Journal]
  19. Scott Davidson
    What's the problem? [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2005, v:22, n:4, pp:392- [Journal]
  20. Scott Davidson
    Guest Editor's Introduction: ITC Examines How Test Helps the Fittest Survive. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2005, v:22, n:6, pp:565- [Journal]
  21. Scott Davidson
    Searching for clues: Diagnosing IC failures. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2006, v:23, n:1, pp:67-68 [Journal]
  22. Scott Davidson
    Twenty Years Ago Today. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2000, v:17, n:1, pp:111-112 [Journal]
  23. Scott Davidson
    All about getting it. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2006, v:23, n:1, pp:80- [Journal]
  24. Scott Davidson
    An insider's look at microprocessor design. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2006, v:23, n:2, pp:162-163 [Journal]
  25. Scott Davidson
    Who Reads This Stuff Anyway? [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2006, v:23, n:4, pp:328- [Journal]
  26. Scott Davidson
    Book Reviews: A Comprehensive EDA Handbook. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2006, v:23, n:5, pp:426-427 [Journal]
  27. Scott Davidson
    Base 1 logic: A method for environmentally friendly PC design. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1996, v:13, n:1, pp:88-0 [Journal]
  28. Scott Davidson
    A test puzzle for a TGIF morning. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1996, v:13, n:2, pp:96-0 [Journal]
  29. Scott Davidson
    Testing in 2100. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2000, v:17, n:4, pp:119-120 [Journal]
  30. Scott Davidson
    How to achieve 95% fault coverage without really trying. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1996, v:13, n:3, pp:120-0 [Journal]
  31. Scott Davidson
    Welcome to 2001. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2001, v:18, n:2, pp:112-0 [Journal]
  32. Scott Davidson
    All I Know I Learned at ITC. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2003, v:20, n:5, pp:104-0 [Journal]
  33. Scott Davidson
    Paperless Design and Test. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2004, v:21, n:1, pp:72-0 [Journal]
  34. Scott Davidson
    George learns test. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1997, v:14, n:1, pp:96-0 [Journal]
  35. Scott Davidson
    Why projects are late. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1997, v:14, n:2, pp:96-0 [Journal]
  36. Scott Davidson
    The Newer Colossus. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1998, v:15, n:2, pp:96-0 [Journal]
  37. Scott Davidson
    A practical look at ATPG. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2004, v:21, n:5, pp:448-449 [Journal]
  38. Scott Davidson
    Minutes Found on a Cave Wall. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1998, v:15, n:3, pp:128-0 [Journal]
  39. Scott Davidson
    The Last Byte. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1998, v:15, n:4, pp:96-0 [Journal]
  40. Scott Davidson
    How Do I Boot Thee? Let Me Check Page 3. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1999, v:16, n:2, pp:96-0 [Journal]
  41. Scott Davidson
    Open-source hardware. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2004, v:21, n:5, pp:456-0 [Journal]
  42. Scott Davidson
    Design illiteracy. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2004, v:21, n:6, pp:608- [Journal]
  43. Scott Davidson
    Testing: It's not just pass/fail anymore. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2005, v:22, n:1, pp:80- [Journal]
  44. Scott Davidson, Justin E. Harlow III
    Guest Editors' Introduction: Benchmarking for Design and Test. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2000, v:17, n:3, pp:12-14 [Journal]
  45. Scott Davidson
    BIST the hard way. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2005, v:22, n:4, pp:386-387 [Journal]
  46. Scott Davidson
    Fast Generation of an Alkane-Series Dictionary Ordered by Side-Chain Complexity. [Citation Graph (0, 0)][DBLP]
    Journal of Chemical Information and Computer Sciences, 2002, v:42, n:2, pp:147-156 [Journal]
  47. Scott Davidson
    An improved IUPAC-based method for identifying alkanes. [Citation Graph (0, 0)][DBLP]
    Journal of Chemical Information and Computer Sciences, 1989, v:29, n:3, pp:151-155 [Journal]
  48. Scott Davidson
    Compact numeric alkane codes derived from IUPAC nomenclature. [Citation Graph (0, 0)][DBLP]
    Journal of Chemical Information and Computer Sciences, 1991, v:31, n:3, pp:417-422 [Journal]
  49. Scott Davidson
    Algorithm for selecting the parent structural unit of a ring-chain assembly. [Citation Graph (0, 0)][DBLP]
    Journal of Chemical Information and Computer Sciences, 1992, v:32, n:3, pp:215-221 [Journal]
  50. Scott Davidson, David Landskov, Bruce Shriver, Patrick W. Mallett
    Some Experiments in Local Microcode Compaction for Horizontal Machines. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 1981, v:30, n:7, pp:460-477 [Journal]

  51. Specifying target resources in a machine independent higher level language. [Citation Graph (, )][DBLP]


  52. Book Reviews: Test Tutorials in Book Form. [Citation Graph (, )][DBLP]


  53. Losing control. [Citation Graph (, )][DBLP]


  54. The Psychology of Electronic Test. [Citation Graph (, )][DBLP]


  55. How do we train today's students to become tomorrow's engineers? [Citation Graph (, )][DBLP]


  56. A laboratory right under your nose. [Citation Graph (, )][DBLP]


  57. A textbook with two target audiences. [Citation Graph (, )][DBLP]


  58. Guest Editors' Introduction: Progress in Test Compression. [Citation Graph (, )][DBLP]


  59. The commonality of vector generation techniques. [Citation Graph (, )][DBLP]


  60. How to make your own processor architecture. [Citation Graph (, )][DBLP]


  61. With pick and shovel through our data. [Citation Graph (, )][DBLP]


  62. A second course on testing [review of System on Chip Test Architectures (Wang, L.-T et al., Eds.; 2007)]. [Citation Graph (, )][DBLP]


  63. Book Review: A book on system test, and testing systems also. [Citation Graph (, )][DBLP]


  64. Book Reviews: A guide for the wrapper perplexed. [Citation Graph (, )][DBLP]


  65. The Last Byte: Too many reboots. [Citation Graph (, )][DBLP]


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