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Paul C. K. Kwok: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Bin Fang, Y. Y. Wang, C. H. Leung, Yuan Yan Tang, Paul C. K. Kwok, K. W. Tse, Y. K. Wong
    A Smoothness Index based Approach for Off-line Signature Verification. [Citation Graph (0, 0)][DBLP]
    ICDAR, 1999, pp:785-787 [Conf]
  2. C. C. Leung, W. F. Chen, Paul C. K. Kwok, F. H. Y. Chan
    Brain tumor boundary detection in MR image with generalized fuzzy operator. [Citation Graph (0, 0)][DBLP]
    ICIP (2), 2003, pp:1057-1060 [Conf]
  3. C. C. Leung, F. H. Y. Chan, Paul C. K. Kwok, W. F. Chen
    Thyroid Cancer Cells Boundary Location by a Fuzzy Edge Detection Method. [Citation Graph (0, 0)][DBLP]
    ICPR, 2000, pp:4360-4363 [Conf]
  4. C. C. Leung, Paul C. K. Kwok, F. H. Y. Chan, W. K. Tsui
    Normalization of Contrast in Document Images Using Generalized Fuzzy Operator with Least Square Method. [Citation Graph (0, 0)][DBLP]
    ICPR (3), 2002, pp:115-118 [Conf]
  5. Paul C. K. Kwok
    A Thinning Algorithm by Contour Generation. [Citation Graph (0, 0)][DBLP]
    Commun. ACM, 1988, v:31, n:11, pp:1314-1324 [Journal]
  6. M. L. Yu, Paul C. K. Kwok, C. H. Leung, K. W. Tse
    Segmentation and recognition of Chinese bank check amounts. [Citation Graph (0, 0)][DBLP]
    IJDAR, 2001, v:3, n:4, pp:207-217 [Journal]
  7. Carlo Arcelli, Gabriella Sanniti di Baja, Paul C. K. Kwok
    Parallel Pattern Compression by Octagonal Propagation. [Citation Graph (0, 0)][DBLP]
    IJPRAI, 1993, v:7, n:5, pp:1077-1102 [Journal]
  8. Bin Fang, Y. Y. Wang, C. H. Leung, K. W. Tse, Yuan Yan Tang, Paul C. K. Kwok, Y. K. Wong
    Offline Signature Verification by the Analysis of Cursive Strokes. [Citation Graph (0, 0)][DBLP]
    IJPRAI, 2001, v:15, n:4, pp:659-673 [Journal]
  9. Bin Fang, C. H. Leung, Yuan Yan Tang, K. W. Tse, Paul C. K. Kwok, Y. K. Wong
    Off-line signature verification by the tracking of feature and stroke positions. [Citation Graph (0, 0)][DBLP]
    Pattern Recognition, 2003, v:36, n:1, pp:91-101 [Journal]
  10. S. Chakraborty, P. T. Lai, Paul C. K. Kwok
    MOS characteristics of NO-grown oxynitrides on n-type 6H-SiC. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:3, pp:455-458 [Journal]
  11. David C. T. Or, P. T. Lai, J. K. O. Sin, Paul C. K. Kwok, J. P. Xu
    Enhanced reliability for low-temperature gate dielectric of MOS devices by N2O or NO plasma nitridation. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:1, pp:163-166 [Journal]
  12. B. L. Yang, Paul C. K. Kwok, P. T. Lai
    Influence of TCE concentration in thermal oxidation on reliability of SiC MOS capacitors under Fowler-Nordheim electron injection. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2006, v:46, n:12, pp:2044-2048 [Journal]

  13. Computer-assisted Diagnosis and Monitoring of Periodontal Diseases. [Citation Graph (, )][DBLP]


  14. Run-time Behavior of Contour Tracing Algorithms for Document Conversion. [Citation Graph (, )][DBLP]


  15. Raster to Vector Conversion in a Map Interpretation System. [Citation Graph (, )][DBLP]


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