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Rene David: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Mireille Jacomino, J. L. Rainard, Rene David
    Fault Detection By Consumption Measurement in CMOS Circuits. [Citation Graph (0, 0)][DBLP]
    Fehlertolerierende Rechensysteme, 1987, pp:83-94 [Conf]
  2. S. Crepaux-Motte, Mireille Jacomino, Rene David
    An algebraic method for delay fault testing. [Citation Graph (0, 0)][DBLP]
    VTS, 1996, pp:308-315 [Conf]

  3. Some relationships between delay testing and stuck-open testing in CMOS circuits. [Citation Graph (, )][DBLP]


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