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R. Chandramouli :
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R. Chandramouli Managing Test and Repair of Embedded Memory Subsystem in SoC. [Citation Graph (0, 0)][DBLP ] Asian Test Symposium, 2005, pp:452- [Conf ] Masood Namjoo , F. Abu-Nofal , Doug Carmean , R. Chandramouli , Y. Chang , J. Goforth , W. Hsu , R. Iwamoto , C. Murphy , U. Naot , Mike Parkin , Joan M. Pendleton , C. Porter , J. Reaves , R. Reddy , George Swan , D. Tinker , P. Tong , L. Yang CMOS Custom Implementation of the SPARC Architecture. [Citation Graph (0, 0)][DBLP ] COMPCON, 1988, pp:18-21 [Conf ] R. Chandramouli , Hector R. Sucar Defect Analysis and Fault Modeling in MOS Technology. [Citation Graph (0, 0)][DBLP ] ITC, 1985, pp:313-321 [Conf ] Loïs Guiller , Frederic Neuveux , S. Duggirala , R. Chandramouli , Rohit Kapur Integrating DFT in the Physical Synthesis Flow. [Citation Graph (0, 0)][DBLP ] ITC, 2002, pp:788-795 [Conf ] R. Chandramouli Preface to Special Session on Recent Advances in Wireless Communication. [Citation Graph (0, 0)][DBLP ] ITCC, 2001, pp:153-0 [Conf ] R. Chandramouli Session Abstract. [Citation Graph (0, 0)][DBLP ] VTS, 2006, pp:420-421 [Conf ] R. Chandramouli Infrastructure IP design for repair in nanometer technologies. [Citation Graph (0, 0)][DBLP ] IEEE Design & Test of Computers, 2005, v:22, n:1, pp:17- [Journal ] Rohit Kapur , R. Chandramouli , Thomas W. Williams Strategies for Low-Cost Test. [Citation Graph (0, 0)][DBLP ] IEEE Design & Test of Computers, 2001, v:18, n:6, pp:47-54 [Journal ] Economics of Security: Research Challenges. [Citation Graph (, )][DBLP ] Search in 0.001secs, Finished in 0.002secs