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C. W. Kok: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Y. Hui, C. W. Kok, T. Q. Nguyen
    Image Compression Using Shift-Invariant Dyadic Wavelets. [Citation Graph (0, 0)][DBLP]
    ICIP (1), 1997, pp:61-64 [Conf]
  2. C. W. Kok, Tsuhan Chen
    Vector Valved Sigma Delta modulators Color Image Applications. [Citation Graph (0, 0)][DBLP]
    ICIP (3), 1997, pp:22-25 [Conf]
  3. S. C. Chan, C. W. Kok, S. W. Chau
    Codebook Generation and Search Algorithm for Vector Quantization Using Arbitrary Hyperplanes. [Citation Graph (0, 0)][DBLP]
    ISCAS, 1993, pp:1885-1888 [Conf]
  4. C. W. Kok, S. C. Chan, C. W. Chau, S. P. Law
    A VLSI architecture for vector quantization with optimal search. [Citation Graph (0, 0)][DBLP]
    ISCAS, 1993, pp:675-678 [Conf]
  5. C. W. Kok, K. Yoneyama, M. Ikehara
    Symmetric extension for finite length multirate signal processing. [Citation Graph (0, 0)][DBLP]
    ISCAS (2), 2001, pp:597-600 [Conf]
  6. C. W. Kok, Yingbo Hua, J. H. Manton
    A nonuniform filterbank structure for channel precoding. [Citation Graph (0, 0)][DBLP]
    ISCAS (2), 2001, pp:541-544 [Conf]
  7. K. F. Chan, Y. T. Wong, C. W. Kok
    Multiresolution mesh representation using vertex cluster contraction. [Citation Graph (0, 0)][DBLP]
    ISCAS (5), 2001, pp:179-182 [Conf]
  8. Kathy Cheung, Cindy Hung, C. W. Kok, Mansun Chan
    A SMIL Browser with an Enhanced Image, Audio and Video Effect Library for Multimedia Rich Presentations. [Citation Graph (0, 0)][DBLP]
    IEEE Pacific Rim Conference on Multimedia, 2001, pp:861-866 [Conf]
  9. K. L. Ng, Nian Zhan, C. W. Kok, M. C. Poon, Hei Wong
    Electrical characterization of the hafnium oxide prepared by direct sputtering of Hf in oxygen with rapid thermal annealing. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:8, pp:1289-1293 [Journal]
  10. Jackie Chan, Hei Wong, M. C. Poon, C. W. Kok
    Oxynitride gate dielectric prepared by thermal oxidation of low-pressure chemical vapor deposition silicon-rich silicon nitride. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:4, pp:611-616 [Journal]
  11. C. K. Wong, H. Wong, M. Chan, C. W. Kok, H. P. Chan
    Minimizing hydrogen content in silicon oxynitride by thermal oxidation of silicon-rich silicon nitride. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2006, v:46, n:12, pp:2056-2061 [Journal]
  12. Nian Zhan, M. C. Poon, Hei Wong, K. L. Ng, C. W. Kok
    Dielectric breakdown characteristics and interface trapping of hafnium oxide films. [Citation Graph (0, 0)][DBLP]
    Microelectronics Journal, 2005, v:36, n:1, pp:29-33 [Journal]

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