Derek C. Stanford, Adrian E. Raftery Finding Curvilinear Features in Spatial Point Patterns: Principal Curve Clustering with Noise. [Citation Graph (0, 0)][DBLP] IEEE Trans. Pattern Anal. Mach. Intell., 2000, v:22, n:6, pp:601-609 [Journal]
Derek C. Stanford, Adrian E. Raftery Approximate Bayes Factors for Image Segmentation: The Pseudolikelihood Information Criterion (PLIC). [Citation Graph (0, 0)][DBLP] IEEE Trans. Pattern Anal. Mach. Intell., 2002, v:24, n:11, pp:1517-1520 [Journal]
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