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William R. Eisenstadt :
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Herman Lam , Stanley Y. W. Su , F. L. C. Seeger , William R. Eisenstadt A Special Function Unit for Database Operations Within a Data-Control Flow System. [Citation Graph (0, 0)][DBLP ] ICPP, 1987, pp:330-339 [Conf ] Donghoon Han , Selim Sermet Akbay , Soumendu Bhattacharya , Abhijit Chatterjee , William R. Eisenstadt On-Chip Self-Calibration of RF Circuits Using Specification-Driven Built-In Self Test (S-BIST). [Citation Graph (0, 0)][DBLP ] IOLTS, 2005, pp:106-111 [Conf ] Sanghoon Choi , William R. Eisenstadt , Robert M. Fox Design of programmable embedded IF source for design self-test. [Citation Graph (0, 0)][DBLP ] ISCAS (5), 2003, pp:241-244 [Conf ] Qizhang Yin , Robert M. Fox , William R. Eisenstadt A translinear-based RF RMS detector for embedded test. [Citation Graph (0, 0)][DBLP ] ISCAS (1), 2004, pp:245-248 [Conf ] Jangsup Yoon , William R. Eisenstadt Lumped passive circuits for 5GHz embedded test of RF SoCs. [Citation Graph (0, 0)][DBLP ] ISCAS (1), 2004, pp:241-244 [Conf ] Tao Zhang , William R. Eisenstadt , Robert M. Fox A novel 5GHz RF power detector. [Citation Graph (0, 0)][DBLP ] ISCAS (1), 2004, pp:897-900 [Conf ] Robert M. Fox , H. J. Ko , William R. Eisenstadt High-gain common-mode feedback circuits for differential log-domain filters. [Citation Graph (0, 0)][DBLP ] ISCAS (1), 2001, pp:560-563 [Conf ] Y. Ro , William R. Eisenstadt , Robert M. Fox New 1.4 volt transconductor with superior power supply rejection. [Citation Graph (0, 0)][DBLP ] ISCAS (2), 1999, pp:644-647 [Conf ] Seongkyun Shin , Yungseon Eo , William R. Eisenstadt , Jongin Shim Analytical Dynamic Time Delay Model of Strongly Coupled RLC Interconnect Lines Dependent on Switching. [Citation Graph (0, 0)][DBLP ] ISQED, 2004, pp:337-342 [Conf ] William R. Eisenstadt Improving Wireless Product Testing via University and Industry Collaboration. [Citation Graph (0, 0)][DBLP ] ITC, 2003, pp:1288- [Conf ] Seongkyun Shin , Yungseon Eo , William R. Eisenstadt , Jongin Shim Analytical signal integrity verification models for inductance-dominant multi-coupled VLSI interconnects. [Citation Graph (0, 0)][DBLP ] SLIP, 2002, pp:61-68 [Conf ] Robert C. Aitken , Mustapha Slamani , H. Ding , William R. Eisenstadt , Sanghoon Choi , John McLaughlin Wireless Test. [Citation Graph (0, 0)][DBLP ] VTS, 2002, pp:173-174 [Conf ] Yungseon Eo , Jongin Shim , William R. Eisenstadt A traveling-wave-based waveform approximation technique for thetiming verification of single transmission lines. [Citation Graph (0, 0)][DBLP ] IEEE Trans. on CAD of Integrated Circuits and Systems, 2002, v:21, n:6, pp:723-730 [Journal ] Yungseon Eo , Seongkyun Shin , William R. Eisenstadt , Jongin Shim Generalized traveling-wave-based waveform approximation technique for the efficient signal integrity verification of multicoupled transmission line system. [Citation Graph (0, 0)][DBLP ] IEEE Trans. on CAD of Integrated Circuits and Systems, 2002, v:21, n:12, pp:1489-1497 [Journal ] Yungseon Eo , Seongkyun Shin , William R. Eisenstadt , Jongin Shim A decoupling technique for efficient timing analysis of VLSI interconnects with dynamic circuit switching. [Citation Graph (0, 0)][DBLP ] IEEE Trans. on CAD of Integrated Circuits and Systems, 2004, v:23, n:9, pp:1321-1337 [Journal ] Kooho Jung , William R. Eisenstadt , Robert M. Fox SPICE-based mixed-mode S-parameter calculations for four-port and three-port circuits. [Citation Graph (0, 0)][DBLP ] IEEE Trans. on CAD of Integrated Circuits and Systems, 2006, v:25, n:5, pp:909-913 [Journal ] Surya Veeraraghavan , Jerry G. Fossum , William R. Eisenstadt SPICE Simulation of SOI MOSFET Integrated Circuits. [Citation Graph (0, 0)][DBLP ] IEEE Trans. on CAD of Integrated Circuits and Systems, 1986, v:5, n:4, pp:653-658 [Journal ] Seongkyun Shin , Yungseon Eo , William R. Eisenstadt , Jongin Shim Analytical models and algorithms for the efficient signal integrity verification of inductance-effect-prominent multicoupled VLSI circuit interconnects. [Citation Graph (0, 0)][DBLP ] IEEE Trans. VLSI Syst., 2004, v:12, n:4, pp:395-407 [Journal ] Xueqing Wang , William R. Eisenstadt , Robert M. Fox Embedded Jitter Measurement of High-speed I/O Signals. [Citation Graph (0, 0)][DBLP ] ISCAS, 2007, pp:153-156 [Conf ] Saleh Abdel-Hafeez , Shadi M. Harb , William R. Eisenstadt Low-Power Content Addressable Memory With Read/Write and Matched Mask Ports. [Citation Graph (0, 0)][DBLP ] PATMOS, 2007, pp:75-85 [Conf ] Woojin Jin , Yungseon Eo , William R. Eisenstadt , Jongin Shim Fast and accurate quasi-three-dimensional capacitance determination of multilayer VLSI interconnects. [Citation Graph (0, 0)][DBLP ] IEEE Trans. VLSI Syst., 2001, v:9, n:3, pp:450-460 [Journal ] High speed digital CMOS divide-by-N fequency divider. [Citation Graph (, )][DBLP ] A low-power CAM using a 12-transistor design cell. [Citation Graph (, )][DBLP ] High speed I/O and thermal effect characterization of 3D stacked ICs. [Citation Graph (, )][DBLP ] Wireless System for Microwave Test Signal Generation. [Citation Graph (, )][DBLP ] Search in 0.002secs, Finished in 0.279secs