The SCEAS System
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J. Raja:
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Publications of Author
- B. Muralikrishnan, K. Najarian, J. Raja
Process Mapping and Functional Correlation in Surface Metrology: A Novel Clustering Application. [Citation Graph (0, 0)][DBLP] ICPR (1), 2002, pp:29-32 [Conf]
Studies on the Application of Carbon Nanotube as Interconnects for Nanometric VLSI Circuits. [Citation Graph (, )][DBLP]
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