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MuDer Jeng: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Chuan-Yu Chang, MuDer Jeng
    A Neural Network Model for the Job-Shop Sheduling Problem with the Consideration of Lots Sizes. [Citation Graph (0, 0)][DBLP]
    ICRA, 1995, pp:202-207 [Conf]
  2. Sheng-Luen Chung, MuDer Jeng
    Normalized In-Line Stepper Coordinator Design by the Sequence Diagram and Production Rules: A Case Study. [Citation Graph (0, 0)][DBLP]
    ICRA, 2002, pp:3169-3174 [Conf]
  3. Sheng-Luen Chung, MuDer Jeng
    AN overview of semiconductor fab automation systems. [Citation Graph (0, 0)][DBLP]
    ICRA, 2003, pp:1050-1055 [Conf]
  4. YiSheng Huang, MuDer Jeng, YuanLin Wen
    Analysis of a Siphon-Based Deadlock Prevention Policy for Flexible Manufacturing Systems. [Citation Graph (0, 0)][DBLP]
    ICRA, 2002, pp:2327-2332 [Conf]
  5. YiSheng Huang, MuDer Jeng, Xiaolan Xie, Sheng-Luen Chung
    A Deadlock Prevention Policy for Flexible Manufacturing Systems Using Siphons. [Citation Graph (0, 0)][DBLP]
    ICRA, 2001, pp:541-546 [Conf]
  6. MuDer Jeng, WeiZhao Lu
    Extension of UML and Its Conversion to Petri Nets for Semiconductor Manufacturing Modeling. [Citation Graph (0, 0)][DBLP]
    ICRA, 2002, pp:3175-3180 [Conf]
  7. MuDer Jeng, Xiaolan Xie
    Modeling and Analysis of Semiconductor Manufacturing Systems with Degraded Behaviors Using Petri Nets and Siphons. [Citation Graph (0, 0)][DBLP]
    ICRA, 2001, pp:52-57 [Conf]
  8. MuDer Jeng, Xiaolan Xie, Sheng-Luen Chung
    ERCN merged nets for modeling degraded behavior and parallel processes in semiconductor manufacturing systems. [Citation Graph (0, 0)][DBLP]
    ICRA, 2003, pp:1033-1038 [Conf]
  9. MuDer Jeng, Xiaolan Xie, YiSheng Huang
    Manufacturing Modeling using Process Nets with Resources. [Citation Graph (0, 0)][DBLP]
    ICRA, 2000, pp:2185-2190 [Conf]
  10. YuanLin Wen, MuDer Jeng, LiDer Jeng, Pei-Shu Fan
    An Intelligent Technique Based on Petri Nets for Diagnosability Enhancement of Discrete Event Systems. [Citation Graph (0, 0)][DBLP]
    KES (2), 2006, pp:879-887 [Conf]
  11. Chuan-Yu Chang, Jia-Wei Chang, MuDer Jeng
    Using a self-organizing neural network for wafer defect inspection. [Citation Graph (0, 0)][DBLP]
    SMC (5), 2004, pp:4312-4317 [Conf]
  12. YuanLin Wen, MuDer Jeng
    Diagnosability of Petri nets. [Citation Graph (0, 0)][DBLP]
    SMC (5), 2004, pp:4891-4896 [Conf]
  13. Fan-Tien Cheng, Haw Ching Yang, Tsung-Liang Luo, Chengche Feng, MuDer Jeng
    Modeling and analysis of equipment managers in manufacturing execution systems for semiconductor packaging. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Systems, Man, and Cybernetics, Part B, 2000, v:30, n:5, pp:772-782 [Journal]
  14. MuDer Jeng
    A Petri net synthesis theory for modeling flexible manufacturing systems. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Systems, Man, and Cybernetics, Part B, 1997, v:27, n:2, pp:169-183 [Journal]
  15. MuDer Jeng, Mao Yu Peng
    Augmented reachability trees for 1-place-unbounded generalized Petri nets. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Systems, Man, and Cybernetics, Part A, 1999, v:29, n:2, pp:173-183 [Journal]
  16. MuDer Jeng, Xiaolan Xie
    Analysis of modularly composed nets by siphons. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Systems, Man, and Cybernetics, Part A, 1999, v:29, n:4, pp:399-406 [Journal]
  17. MuDer Jeng, Xiaolan Xie, Sheng-Luen Chung
    ERCN* merged nets for modeling degraded behavior and parallel processes in semiconductor manufacturing systems. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Systems, Man, and Cybernetics, Part A, 2004, v:34, n:1, pp:102-112 [Journal]
  18. MuDer Jeng, Xiaolan Xie, WenYuan Hung
    Markovian timed Petri nets for performance analysis of semiconductor manufacturing systems. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Systems, Man, and Cybernetics, Part B, 2000, v:30, n:5, pp:757-771 [Journal]
  19. Da-Yin Liao, MuDer Jeng, Mengchu Zhou
    Petri Net Modeling and Lagrangian Relaxation Approach to Vehicle Scheduling in 300 mm Semiconductor Manufacturing. [Citation Graph (0, 0)][DBLP]
    ICRA, 2004, pp:5301-5306 [Conf]
  20. Chuan-Yu Chang, Jia-Wei Chang, MuDer Jeng
    An Unsupervised Self-Organizing Neural Network for Automatic Semiconductor Wafer Defect Inspection. [Citation Graph (0, 0)][DBLP]
    ICRA, 2005, pp:3000-3005 [Conf]
  21. Chii-Ruey Lin, Pei-Shu Fan, Yea-Jou Shiau, MuDer Jeng
    An Agent-Based Early Manufacturability Assessment for Collaborative Design in Coating Process. [Citation Graph (0, 0)][DBLP]
    KES (2), 2007, pp:649-655 [Conf]
  22. YuanLin Wen, Sheng-Luen Chung, LiDer Jeng, MuDer Jeng
    Intelligent Design of Diagnosable Systems: A Case Study of Semiconductor Manufacturing Machines. [Citation Graph (0, 0)][DBLP]
    KES (2), 2007, pp:877-884 [Conf]

  23. Diagnosable discrete event systems design. [Citation Graph (, )][DBLP]


  24. Automatic Die Inspection for Post-sawing LED Wafers. [Citation Graph (, )][DBLP]


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