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Hyung Suck Cho: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. In-Soo Jeong, Hyung Suck Cho
    Self-localization for Mobile Robots by Matching Two Consecutive Environmental Range Data. [Citation Graph (0, 0)][DBLP]
    ICRA, 2001, pp:1603-1608 [Conf]
  2. Whee Kuk Kim, Yong-kyu Byun, Hyung Suck Cho
    Closed Form Solution of Forward Position Analysis for a 6 DOF 3-PPSP Parallel Mechanism of General Geometry. [Citation Graph (0, 0)][DBLP]
    ICRA, 1998, pp:1659-1664 [Conf]
  3. Dong-Soo Kwon, Ki Young Woo, Hyung Suck Cho
    Haptic Control of the Master Hand Controller for a Microsurgical Telerobot System. [Citation Graph (0, 0)][DBLP]
    ICRA, 1999, pp:1722-1727 [Conf]
  4. Kuk Won Ko, Young Jun Roh, Hyung Suck Cho, Hyung Cheol Kim
    A Neural Network Approach to the Inspection of Ball Grid Array Solder Joints on Printed Circuit Boards. [Citation Graph (0, 0)][DBLP]
    IJCNN (5), 2000, pp:233-238 [Conf]
  5. Jae seon Kim, Kyoung Chul Koh, Hyung Suck Cho
    An active contour model with shape regulation scheme. [Citation Graph (0, 0)][DBLP]
    Advanced Robotics, 2000, v:14, n:6, pp:495-514 [Journal]
  6. Yong-kyu Byun, Hyung Suck Cho
    Analysis of a Novel 6-DOF, 3-PPSP Parallel Manipulator. [Citation Graph (0, 0)][DBLP]
    I. J. Robotic Res., 1997, v:16, n:6, pp:859-872 [Journal]
  7. Whee Kuk Kim, Yong Kyu Byun, Hyung Suck Cho
    Closed-Form Forward-Position Solution for a 6-Dof 3-PPSP Parallel Mechanism and Its Implementation. [Citation Graph (0, 0)][DBLP]
    I. J. Robotic Res., 2001, v:20, n:1, pp:85-99 [Journal]
  8. Young Jun Roh, Won Shik Park, Hyung Suck Cho
    Correcting image distortion in the X-ray digital tomosynthesis system for PCB solder joint inspection. [Citation Graph (0, 0)][DBLP]
    Image Vision Comput., 2003, v:21, n:12, pp:1063-1075 [Journal]
  9. Sung Joon Ahn, Wolfgang Rauh, Hyung Suck Cho, Hans-Jürgen Warnecke
    Orthogonal Distance Fitting of Implicit Curves and Surfaces. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Pattern Anal. Mach. Intell., 2002, v:24, n:5, pp:620-638 [Journal]

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