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K. Kobayashi: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. K. Kobayashi, Y. Takahashi
    Tail probability of a Gaussian fluid queue under finite measurement of input processes. [Citation Graph (0, 0)][DBLP]
    PMCCN, 1997, pp:43-58 [Conf]
  2. N. Kurosawa, H. Kobayashi, K. Kobayashi
    Channel linearity mismatch effects in time-interleaved ADC systems. [Citation Graph (0, 0)][DBLP]
    ISCAS (1), 2001, pp:420-423 [Conf]
  3. K. Kobayashi, M. Fujii, M. Hayamizu, K. Ujihara
    Data Sharing of Shape Model with VRML Environment. [Citation Graph (0, 0)][DBLP]
    PROLAMAT, 1998, pp:187-194 [Conf]
  4. K. Kobayashi, Y. Takahashi
    Steady-State Analysis of ATM Multiplexer with Variable Input Rate Through Diffusion Approximation. [Citation Graph (0, 0)][DBLP]
    Perform. Eval., 1995, v:23, n:2, pp:163-184 [Journal]
  5. K. Kobayashi, Y. Takahashi
    Overflow probability for a discrete-time queue with non-stationary multiplexed input. [Citation Graph (0, 0)][DBLP]
    Telecommunication Systems, 2000, v:15, n:1-2, pp:157-166 [Journal]
  6. A. Teramoto, H. Umeda, K. Azamawari, K. Kobayashi, K. Shiga, J. Komori, Y. Ohno, A. Shigetomi
    Time-dependent dielectric breakdown of SiO2 films in a wide electric field range. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:1, pp:47-52 [Journal]
  7. M. Nakabayashi, H. Ohyama, E. Simoen, M. Ikegami, C. Claeys, K. Kobayashi, M. Yoneoka, K. Miyahara
    Reliability of polycrystalline silicon thin film resistors. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:9-10, pp:1341-1346 [Journal]
  8. H. Ohyama, E. Simoen, S. Kuroda, C. Claeys, Y. Takami, T. Hakata, K. Kobayashi, M. Nakabayashi, H. Sunaga
    Degradation and recovery of AlGaAs/GaAs p-HEMT irradiated by high-energy particle. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:1, pp:79-85 [Journal]
  9. H. Ohyama, M. Nakabayashi, E. Simoen, C. Claeys, T. Tanaka, T. Hirao, S. Onada, K. Kobayashi
    Radiation damages of polycrystalline silicon films and npn Si transistors by high-energy particle irradiation. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:9-10, pp:1443-1448 [Journal]

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