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Alessandra Fudoli:
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- Davide Appello, Alessandra Fudoli, Vincenzo Tancorre, Fulvio Corno, Maurizio Rebaudengo, Matteo Sonza Reorda
A BIST-Based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques. [Citation Graph (0, 0)][DBLP] IOLTW, 2002, pp:206-210 [Conf]
- Davide Appello, Paolo Bernardi, Alessandra Fudoli, Maurizio Rebaudengo, Matteo Sonza Reorda, Vincenzo Tancorre, Massimo Violante
Exploiting Programmable BIST For The Diagnosis of Embedded Memory Cores. [Citation Graph (0, 0)][DBLP] ITC, 2003, pp:379-385 [Conf]
- Aubin Roy, Stephen K. Sunter, Alessandra Fudoli, Davide Appello
High Accuracy Stimulus Generation for A/D Converter BIST. [Citation Graph (0, 0)][DBLP] ITC, 2002, pp:1031-1039 [Conf]
- Davide Appello, Alessandra Fudoli, Vincenzo Tancorre, Fulvio Corno, Maurizio Rebaudengo, Matteo Sonza Reorda
A BIST-Based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques. [Citation Graph (0, 0)][DBLP] MTDT, 2002, pp:12-16 [Conf]
- Davide Appello, Alessandra Fudoli, Katia Giarda, Emil Gizdarski, Ben Mathew, Vincenzo Tancorre
Yield Analysis of Logic Circuits. [Citation Graph (0, 0)][DBLP] VTS, 2004, pp:103-108 [Conf]
- Davide Appello, Alessandra Fudoli, Katia Giarda, Vincenzo Tancorre, Emil Gizdarski, Ben Mathew
Understanding Yield Losses in Logic Circuits. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 2004, v:21, n:3, pp:208-215 [Journal]
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