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Vincenzo Tancorre: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Davide Appello, Alessandra Fudoli, Vincenzo Tancorre, Fulvio Corno, Maurizio Rebaudengo, Matteo Sonza Reorda
    A BIST-Based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques. [Citation Graph (0, 0)][DBLP]
    IOLTW, 2002, pp:206-210 [Conf]
  2. Davide Appello, Paolo Bernardi, Alessandra Fudoli, Maurizio Rebaudengo, Matteo Sonza Reorda, Vincenzo Tancorre, Massimo Violante
    Exploiting Programmable BIST For The Diagnosis of Embedded Memory Cores. [Citation Graph (0, 0)][DBLP]
    ITC, 2003, pp:379-385 [Conf]
  3. Davide Appello, Alessandra Fudoli, Vincenzo Tancorre, Fulvio Corno, Maurizio Rebaudengo, Matteo Sonza Reorda
    A BIST-Based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques. [Citation Graph (0, 0)][DBLP]
    MTDT, 2002, pp:12-16 [Conf]
  4. Davide Appello, Alessandra Fudoli, Katia Giarda, Emil Gizdarski, Ben Mathew, Vincenzo Tancorre
    Yield Analysis of Logic Circuits. [Citation Graph (0, 0)][DBLP]
    VTS, 2004, pp:103-108 [Conf]
  5. Davide Appello, Vincenzo Tancorre, Paolo Bernardi, Michelangelo Grosso, Maurizio Rebaudengo, Matteo Sonza Reorda
    On the Automation of the Test Flow of Complex SoCs. [Citation Graph (0, 0)][DBLP]
    VTS, 2006, pp:166-171 [Conf]
  6. Davide Appello, Alessandra Fudoli, Katia Giarda, Vincenzo Tancorre, Emil Gizdarski, Ben Mathew
    Understanding Yield Losses in Logic Circuits. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2004, v:21, n:3, pp:208-215 [Journal]

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