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H. Lapuyade: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. V. Pouget, H. Lapuyade, P. Fouillat, D. Lewis, S. Buchner
    Theoretical Investigation of an Equivalent Laser LET. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:9-10, pp:1513-1518 [Journal]
  2. D. Lewis, V. Pouget, T. Beauchêne, H. Lapuyade, P. Fouillat, A. Touboul, Felix Beaudoin, Philippe Perdu
    Front Side and Backside OBIT Mappings applied to Single Event Transient Testing. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:9-10, pp:1471-1476 [Journal]
  3. F. Darracq, H. Lapuyade, N. Buard, P. Fouillat, R. Dufayel, T. Carriere
    Low-cost backside laser test method to pre-characterize the COTS IC's sensitivity to Single Event Effects. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:9-11, pp:1615-1619 [Journal]

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