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F. Darracq:
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Publications of Author
- D. Lewis, H. Lapuyade, Yann Deval, Y. Maidon, F. Darracq, R. Briand, P. Fouillat
A New Laser System for X-Rays Flashes Sensitivity Evaluation. [Citation Graph (0, 0)][DBLP] IOLTW, 2001, pp:111-0 [Conf]
- F. Darracq, H. Lapuyade, N. Buard, P. Fouillat, R. Dufayel, T. Carriere
Low-cost backside laser test method to pre-characterize the COTS IC's sensitivity to Single Event Effects. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2003, v:43, n:9-11, pp:1615-1619 [Journal]
- F. Essely, F. Darracq, V. Pouget, M. Remmach, Felix Beaudoin, N. Guitard, M. Bafleur, Philippe Perdu, A. Touboul, D. Lewis
Application of various optical techniques for ESD defect localization. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2006, v:46, n:9-11, pp:1563-1568 [Journal]
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