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V. Pouget: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]
Publications of Author
- V. Pouget, H. Lapuyade, P. Fouillat, D. Lewis, S. Buchner
Theoretical Investigation of an Equivalent Laser LET. [Citation Graph (0, 0)][DBLP]
Microelectronics Reliability, 2001, v:41, n:9-10, pp:1513-1518 [Journal] - D. Lewis, V. Pouget, T. Beauchêne, H. Lapuyade, P. Fouillat, A. Touboul, Felix Beaudoin, Philippe Perdu
Front Side and Backside OBIT Mappings applied to Single Event Transient Testing. [Citation Graph (0, 0)][DBLP]
Microelectronics Reliability, 2001, v:41, n:9-10, pp:1471-1476 [Journal] - Felix Beaudoin, Romain Desplats, Philippe Perdu, Abdellatif Firiti, G. Haller, V. Pouget, D. Lewis
From Static Thermal and Photoelectric Laser Stimulation (TLS/PLS) to Dynamic Laser Testing. [Citation Graph (0, 0)][DBLP]
Microelectronics Reliability, 2003, v:43, n:9-11, pp:1681-1686 [Journal] - T. Beauchêne, D. Lewis, Felix Beaudoin, V. Pouget, Romain Desplats, P. Fouillat, Philippe Perdu, M. Bafleur, D. Trémouilles
Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization. [Citation Graph (0, 0)][DBLP]
Microelectronics Reliability, 2003, v:43, n:3, pp:439-444 [Journal] - G. Andriamonje, V. Pouget, Y. Ousten, D. Lewis, Y. Danto, J. M. Rampnoux, Y. Ezzahri, Stefan Dilhaire, Stéphane Grauby, Wilfrid Claeys
Application of Picosecond Ultrasonics to Non-Destructive Analysis in VLSI circuits. [Citation Graph (0, 0)][DBLP]
Microelectronics Reliability, 2003, v:43, n:9-11, pp:1803-1807 [Journal] - T. Beauchêne, D. Lewis, Felix Beaudoin, V. Pouget, Philippe Perdu, P. Fouillat, Y. Danto
A physical approach on SCOBIC investigation in VLSI. [Citation Graph (0, 0)][DBLP]
Microelectronics Reliability, 2003, v:43, n:1, pp:173-177 [Journal] - N. Guitard, F. Essely, D. Trémouilles, M. Bafleur, N. Nolhier, Philippe Perdu, A. Touboul, V. Pouget, D. Lewis
Different Failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure. [Citation Graph (0, 0)][DBLP]
Microelectronics Reliability, 2005, v:45, n:9-11, pp:1415-1420 [Journal] - A. Douin, V. Pouget, M. De Matos, D. Lewis, Philippe Perdu, P. Fouillat
Time resolved imaging using synchronous picosecond Photoelectric Laser Stimulation. [Citation Graph (0, 0)][DBLP]
Microelectronics Reliability, 2006, v:46, n:9-11, pp:1514-1519 [Journal] - F. Essely, F. Darracq, V. Pouget, M. Remmach, Felix Beaudoin, N. Guitard, M. Bafleur, Philippe Perdu, A. Touboul, D. Lewis
Application of various optical techniques for ESD defect localization. [Citation Graph (0, 0)][DBLP]
Microelectronics Reliability, 2006, v:46, n:9-11, pp:1563-1568 [Journal]
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