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Publications of Author

1. Tino Heijmen
   Analytical Semi-Empirical Model for SER Sensitivity Estimation of Deep-Submicron CMOS Circuits. [Citation Graph (0, 0)][DBLP]
   IOLTS, 2005, pp:3-8 [Conf]
   
2. Tino Heijmen
   Soft Error Rates in Deep-Submicron CMOS Technologies. [Citation Graph (0, 0)][DBLP]
   IOLTS, 2006, pp:271- [Conf]
   
3. Tino Heijmen, Damien Giot, Philippe Roche
   Factors That Impact the Critical Charge of Memory Elements. [Citation Graph (0, 0)][DBLP]
   IOLTS, 2006, pp:57-62 [Conf]
   
4. Tino Heijmen
   Spread in Alpha-Particle-Induced Soft-Error Rate of 90-nm Embedded SRAMs. [Citation Graph (0, 0)][DBLP]
   IOLTS, 2007, pp:131-136 [Conf]
   
5. Tino Heijmen, André Nieuwland
   Soft-Error Rate Testing of Deep-Submicron Integrated Circuits. [Citation Graph (0, 0)][DBLP]
   European Test Symposium, 2006, pp:247-252 [Conf]
   
6. 
   Special Session 3 - Panel: SER in Automotive: what is the impact of the AEC Q100-G spec? [Citation Graph (, )][DBLP]
   
   
7. 
   Soft-Error Vulnerability of Sub-100-nm Flip-Flops. [Citation Graph (, )][DBLP]