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T. Carriere: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. F. Darracq, H. Lapuyade, N. Buard, P. Fouillat, R. Dufayel, T. Carriere
    Low-cost backside laser test method to pre-characterize the COTS IC's sensitivity to Single Event Effects. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:9-11, pp:1615-1619 [Journal]

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