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Publications of Author

1. Zdzislaw Czarnul, Shigetaka Takagi, Nobuo Fujii, Tetsuya Iida, Takeshi Yanagisawa
   Principles of nonlinearity Cancellation in Linear MOS Systems using MRC Circuits. [Citation Graph (0, 0)][DBLP]
   ISCAS, 1994, pp:217-220 [Conf]
   
2. Makoto Nakamura, Hiroyuki Kamezawa, Junji Tamatsukuri, Mary Inaba, Kei Hiraki, K. Mizuguchi, K. Torii, S. Nakano, Shizuo Yoshita, Ryutaro Kurusu, M. Sakamoto, Y. Furukawa, Takeshi Yanagisawa, Yukichi Ikuta, J. Shitami, Akira Zinzaki
   Long Fat Pipe Congestion Control for Multi-Stream Data Transfer. [Citation Graph (0, 0)][DBLP]
   ISPAN, 2004, pp:294-299 [Conf]
   
3. Takeshi Yanagisawa, Takeshi Kojima, Tadamasa Koyanagi, Kiyoshi Takahisa, Kuniomi Nakamura
   Changes in the characteristics of CuInGaSe₂ solar cells under light irradiation and during recovery: degradation analysis by the feeble light measuring method. [Citation Graph (0, 0)][DBLP]
   Microelectronics Reliability, 2002, v:42, n:2, pp:219-223 [Journal]
   
4. Takeshi Yanagisawa, Takeshi Kojima
   The stability of the CuInSe₂ solar mini-module I-V characteristics under continuous and light/dark irradiation cycle tests. [Citation Graph (0, 0)][DBLP]
   Microelectronics Reliability, 2003, v:43, n:3, pp:503-507 [Journal]
   
5. Takeshi Yanagisawa, Takeshi Kojima
   Degradation of InGaN blue light-emitting diodes under continuous and low-speed pulse operations. [Citation Graph (0, 0)][DBLP]
   Microelectronics Reliability, 2003, v:43, n:6, pp:977-980 [Journal]
   
6. Takeshi Yanagisawa, Takeshi Kojima, Tadamasa Koyanagi
   Behavior of Cu(In, Ga)Se₂ solar cells under light/damp heat over time. [Citation Graph (0, 0)][DBLP]
   Microelectronics Reliability, 2004, v:44, n:2, pp:229-235 [Journal]