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Hanqing Xing:
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- Xin Dai, Chengming He, Hanqing Xing, Degang Chen, Randall L. Geiger
An N/sup th/ order central symmetrical layout pattern for nonlinear gradients cancellation. [Citation Graph (0, 0)][DBLP] ISCAS (5), 2005, pp:4835-4838 [Conf]
- Hanqing Xing, Degang Chen, Randall L. Geiger
A two-step DDEM ADC for accurate and cost-effective DAC testing. [Citation Graph (0, 0)][DBLP] ISCAS (5), 2005, pp:4289-4292 [Conf]
- Hanqing Xing, Le Jin, Degang Chen, Randall L. Geiger
Characterization of a current-mode bandgap circuit structure for high-precision reference applications. [Citation Graph (0, 0)][DBLP] ISCAS, 2006, pp:- [Conf]
- Le Jin, Hanqing Xing, Degang Chen, R. Geiger
A self-calibrated bandgap voltage reference with 0.5 ppm/°C temperature coefficient. [Citation Graph (0, 0)][DBLP] ISCAS, 2006, pp:- [Conf]
- Hanqing Xing, Degang Chen, R. Geiger
Linearity test for high resolution DACs using low-accuracy DDEM flash ADCs. [Citation Graph (0, 0)][DBLP] ISCAS, 2006, pp:- [Conf]
A test strategy for time-to-digital converters using dynamic element matching and dithering. [Citation Graph (, )][DBLP]
System identification -based reduced-code testing for pipeline ADCs' linearity test. [Citation Graph (, )][DBLP]
On-chip at-speed linearity testing of high-resolution high-speed DACs using DDEM ADCs with dithering. [Citation Graph (, )][DBLP]
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