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Le Jin: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Chengming He, Le Jin, Degang Chen, Randall L. Geiger
    Robust design of high gain amplifiers using dynamical systems and bifurcation theory. [Citation Graph (0, 0)][DBLP]
    ISCAS (1), 2004, pp:481-484 [Conf]
  2. Le Jin, Degang Chen, Randall L. Geiger
    A digital self-calibration algorithm for ADCs based on histogram test using low-linearity input signals. [Citation Graph (0, 0)][DBLP]
    ISCAS (2), 2005, pp:1378-1381 [Conf]
  3. Le Jin, Chengming He, Degang Chen, Randall L. Geiger
    An SoC compatible linearity test approach for precision ADCs using easy-to-generate sinusoidal stimuli. [Citation Graph (0, 0)][DBLP]
    ISCAS (1), 2004, pp:928-931 [Conf]
  4. Le Jin, Chengming He, Degang Chen, Randall L. Geiger
    Fast implementation of a linearity test approach for high-resolution ADCs using non-linear ramp signals. [Citation Graph (0, 0)][DBLP]
    ISCAS (1), 2004, pp:932-935 [Conf]
  5. Kumar L. Parthasarathy, Le Jin, Turker Kuyel, Dana Price, Degang Chen, Randall L. Geiger
    Experimental evaluation and validation of a BIST algorithm for characterization of A/D converter performance. [Citation Graph (0, 0)][DBLP]
    ISCAS (5), 2003, pp:537-540 [Conf]
  6. Le Jin, Kumar Parthasarathy, Turker Kuyel, Degang Chen, Randall L. Geiger
    Linearity Testing of Precision Analog-to-Digital Converters Using Stationary Nonlinear Inputs. [Citation Graph (0, 0)][DBLP]
    ITC, 2003, pp:218-227 [Conf]
  7. Le Jin, Degang Chen, Randall L. Geiger
    Code-Density Test of Analog-to-Digital Converters Using Single Low-Linearity Stimulus Signal. [Citation Graph (0, 0)][DBLP]
    VTS, 2007, pp:303-310 [Conf]
  8. Kumar Parthasarathy, Turker Kuyel, Dana Price, Le Jin, Degang Chen, Randall L. Geiger
    BIST and production testing of ADCs using imprecise stimulus. [Citation Graph (0, 0)][DBLP]
    ACM Trans. Design Autom. Electr. Syst., 2003, v:8, n:4, pp:522-545 [Journal]
  9. Hanqing Xing, Le Jin, Degang Chen, Randall L. Geiger
    Characterization of a current-mode bandgap circuit structure for high-precision reference applications. [Citation Graph (0, 0)][DBLP]
    ISCAS, 2006, pp:- [Conf]
  10. Le Jin, Hanqing Xing, Degang Chen, R. Geiger
    A self-calibrated bandgap voltage reference with 0.5 ppm/°C temperature coefficient. [Citation Graph (0, 0)][DBLP]
    ISCAS, 2006, pp:- [Conf]

  11. Low Cost Dynamic Test Methodology for High Precision ΣD ADCs. [Citation Graph (, )][DBLP]

  12. A test strategy for time-to-digital converters using dynamic element matching and dithering. [Citation Graph (, )][DBLP]

  13. System identification -based reduced-code testing for pipeline ADCs' linearity test. [Citation Graph (, )][DBLP]

  14. Testing of High Resolution ADCs Using Lower Resolution DACs via Iterative Transfer Function Estimation. [Citation Graph (, )][DBLP]

  15. Grey Synthetical Prediction Model of Military Logistics Based on Evolutionary Neural Network. [Citation Graph (, )][DBLP]

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