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Benjamin Van Camp: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Markus P. J. Mergens, Geert Wybo, Bart Keppens, Benjamin Van Camp, Frederic De Ranter, Koen G. Verhaege, John Armer, Phillip Jozwiak, Christian C. Russ
    ESD protection circuit design for ultra-sensitive IO applications in advanced sub-90nm CMOS technologies. [Citation Graph (0, 0)][DBLP]
    ISCAS (2), 2005, pp:1194-1197 [Conf]
  2. Bart Keppens, Markus P. J. Mergens, Cong Son Trinh, Christian C. Russ, Benjamin Van Camp, Koen G. Verhaege
    ESD protection solutions for high voltage technologies. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2006, v:46, n:5-6, pp:677-688 [Journal]

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